arrow
返回
P

Peter Hacke

national renewable energy laboratory

39H指数
259论文数
6.2K被引数
收录论文 48
发表时间
PVDF-based backsheet cracking: Mapping in situ phase evolution by X-ray scattering基于PVDF的背板开裂: 通过x射线散射绘制原位相演化图
err2025-04-01
err0
PREAI
errMoffitt, Stephanie L.; Ulicna, Sona; Jhang, Song-Syun; Pan, Po-Chang; Owen-Bellini, Michael; Hacke, Peter; Kempe, Michael D.; Tracy, Jared; Choudhury, Kaushik R.; Schelhas, Laura T.; Gu, Xiaohong
err分享
err收藏
Photovoltaic cable jackets - A comparison of representative products using combined-accelerated stress testing
err2025-04-01
err0
PREAI
errMiller, David C.; Arnold, Rachael L.; Hacke, Peter L.; Jackson, Aubrey; Jiang, Chun-Sheng; Hayden, Steven C.; Moutinho, Helio; Newkirk, Jimmy M.; Perrin, Greg; Schelhas, Laura T.; Terwilliger, Kent
err分享
err收藏
err分享
err收藏
err分享
err收藏
Susceptibility to polarization type potential induced degradation in commercial bifacial p-PERC PV modules
err2023-06-20
err2
PREAI
errMahmood, Farrukh Ibne; Li, Fang; Hacke, Peter; Molto, Cecile; Colvin, Dylan; Seigneur, Hubert; TamizhMani, Govindasamy
err分享
err收藏
Acceleration Factors for Combined-Accelerated Stress Testing of Photovoltaic Modules光伏组件联合加速应力测试的加速因子
err2023-05-04
err6
errOAAI
errHacke, Peter; Owen-Bellini, Michael; Kempe, Michael D.; Sulas-Kern, Dana B.; Miller, David C.; Jankovec, Marko; Mitterhofer, Stefan; Topic, Marko; Spataru, Sergiu; Gambogi, William; Tanahashi, Tadanori
err分享
err收藏
Quantifying optical loss of high-voltage degradation modes in photovoltaic modules using spectral analysis
err2023-03-24
err2
PREAI
errMiller, David C.; Hurst, Katherine E.; Sinha, Archana; Qian, Jiadong; Moffitt, Stephanie L.; Ulicna, Sona; Schelhas, Laura T.; Hacke, Peter
err分享
err收藏
Electrochemical mechanisms of leakage-current in photovoltaic modules
err2023-02-16
err4
errOAAI
errKempe, Michael; Hacke, Peter; Morse, Joshua; Li, Jichao; Shen, Yu-Chen; Han, Katherine
err分享
err收藏
Review of Potential-Induced Degradation in Bifacial Photovoltaic Modules双面光伏组件的电位诱导退化研究综述
err2023-02-10
err20
errOAAI
errMolto, Cecile; Oh, Jaewon; Mahmood, Farrukh Ibne; Li, Mengjie; Hacke, Peter; Li, Fang; Smith, Ryan; Colvin, Dylan; Matam, Manjunath; DiRubio, Christopher; Tamizhmani, Govindasamy; Seigneur, Hubert
err分享
err收藏
Evaluation of bifacial module technologies with combined-accelerated stress testing
err2022-10-28
err6
errOAAI
errHacke, Peter; Kumar, Akash; Terwilliger, Kent; Ndione, Paul; Spataru, Sergiu; Pavgi, Ashwini; Choudhury, Kaushik Roy; Tamizhmani, Govindasamy
err分享
err收藏
A study of degradation mechanisms in PVDF-based photovoltaic backsheets
err2022-08-24
err20
errOAAI
errUlicna, Sona; Owen-Bellini, Michael; Moffitt, Stephanie L.; Sinha, Archana; Tracy, Jared; Roy-Choudhury, Kaushik; Miller, David C.; Hacke, Peter; Schelhas, Laura T.
err分享
err收藏
UV-induced degradation of high-efficiency silicon PV modules with different cell architectures
err2022-07-07
err57
errOAAI
errSinha, Archana; Qian, Jiadong; Moffitt, Stephanie L.; Hurst, Katherine; Terwilliger, Kent; Miller, David C.; Schelhas, Laura T.; Hacke, Peter
err分享
err收藏
Potential-induced degradation of Cu(In,Ga)Se2 can occur by shunting the front i-ZnO and by damaging the p-n junction
err2022-01-01
err4
errOAAI
errMuzzillo, Christopher P.; Terwilliger, Kent; Hacke, Peter; Moutinho, Helio R.; Young, Matthew R.; Glynn, Stephen; Stevens, Bart; Repins, Ingrid L.; Mansfield, Lorelle M.
err分享
err收藏
Understanding interfacial chemistry of positive bias high-voltage degradation in photovoltaic modules
err2021-05-01
err15
errOAAI
errSinha, Archana; Moffitt, Stephanie L.; Hurst, Katherine; Kempe, Michael; Han, Katherine; Shen, Yu-Chen; Miller, David C.; Hacke, Peter; Schelhas, Laura T.
err分享
err收藏
Towards validation of combined-accelerated stress testing through failure analysis of polyamide-based photovoltaic backsheets
err2021-01-21
err21
errOAAI
errOwen-Bellini, Michael; Moffitt, Stephanie L.; Sinha, Archana; Maes, Ashley M.; Meert, Joseph J.; Karin, Todd; Takacs, Chris; Jenket, Donald R.; Hartley, James Y.; Miller, David C.; Hacke, Peter; Schelhas, Laura T.
err分享
err收藏
Evaluation of the DC bus link capacitors and power transistor modules in the qualification testing of PV inverters
err2020-10-15
err4
errOAAI
errHacke, Peter; Clemens, Daniel; Thiagarajan, Ramanathan; Flicker, Jack; Igarashi, Hironobu
err分享
err收藏