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J

Jean‐Paul Barnes

univ. grenoble alpes, cea and leti

31H指数
246论文数
3.8K被引数
收录论文 33
发表时间
Design; Implantation; and Biodistribution Study of a Resorbable Epidural Electrode Array Embedding Bioresorbable Polymeric Conductive Ink设计;植入;以及一种可吸收硬膜外电极阵列嵌入可生物降解聚合物导电墨水的研究
err2026-05-26
err0
PREAI
errSimon Regal; Jenny Molet; Benoit Gilquin; Christophe Gaude; David Ratel; Napoléon Torres; Aline Lamboux; Vincent Balter; Lina Jolivet; Maxime Leprince; Pascal Mailley; Constantin Matei; Jean-Paul Barnes; Lucas Struber; Rachel Auzély-Velty; Isabelle Texier; Fabien Sauter-Starace
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Thermal Atomic Layer Deposition of Ultrathin LiPON at a 200 mm Wafer-Scale200毫米晶圆级热原子层沉积超薄LiPON
err2026-03-01
err0
PREAI
errPoulet, Sylvain; Letiche, Manon; Gauthier, Nicolas; Ghandari, Ilyass; Massoni, Nicolas; Barnes, Jean-Paul; Salvador, Violaine; Bedjaoui, Messaoud
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Subcellular ToF-SIMS Imaging of the Snow Alga Sanguina nivaloides by Combining High Mass and High Lateral Resolution Acquisitions
err2024-12-06
err0
PREAI
errSeydoux, Claire; Ezzedine, Jade A.; Larbi, Gregory Si; Ravanel, Stephane; Marechal, Eric; Barnes, Jean-Paul; Jouneau, Pierre-Henri
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Investigation of sidewall damage induced by reactive ion etching on AlGaInP MESA for micro-LED application
err2021-06-01
err56
errOAAI
errBoussadi, Younes; Rochat, Nevine; Barnes, Jean-Paul; Ben Bakir, Badhise; Ferrandis, Philippe; Masenelli, Bruno; Licitra, Christophe
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Investigation of recrystallization and stress relaxation in nanosecond laser annealed Si1-xGex/Si epilayers
err2020-10-01
err28
errOAAI
errDagault, L.; Kerdiles, S.; Alba, P. Acosta; Hartmann, J-M; Barnes, J-P; Gergaud, P.; Scheid, E.; Cristiano, F.
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Elemental Characterization of Al Nanoparticles Buried under a Cu Thin Film: TOF-SIMS vs STEM/EDX
err2020-08-18
err18
errOAAI
errPriebe, Agnieszka; Barnes, Jean-Paul; Edwards, Thomas Edward James; Huszar, Emese; Pethoe, Laszlo; Michler, Johann
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3D Imaging of Nanoparticles in an Inorganic Matrix Using TOF-SIMS Validated with STEM and EDX
err2019-08-20
err25
errOAAI
errPriebe, Agnieszka; Barnes, Jean-Paul; Edwards, Thomas Edward James; Petho, Laszlo; Balogh, Istvan; Michler, Johann
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Direct examination of Si atoms spatial distribution and clustering in GaAs thin films with atom probe tomography
err2018-08-01
err7
PREAI
errBeainy, Georges; Alcotte, Reynald; Bassani, Franck; Martin, Mickael; Grenier, Adeline; Baron, Thierry; Barnes, Jean-Paul
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Atom probe tomography for advanced nanoelectronic devices: Current status and perspectives
err2018-04-01
err20
PREAI
errBarnes, J. P.; Grenier, A.; Mouton, I.; Barraud, S.; Audoit, G.; Bogdanowicz, J.; Fleischmann, C.; Melkonyan, D.; Vandervorst, W.; Duguay, S.; Rolland, N.; Vurpillot, F.; Blavette, D.
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Role of the chemical composition and structure on the electrical properties of a solid state electrolyte: Case of a highly conductive LiPON
err2018-01-01
err35
PREAI
errLe Van-Jodin, Lucie; Claudel, Arnaud; Secouard, Christophe; Sabary, Frederic; Barnes, Jean-Paul; Martin, Steve
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ToF-SIMS Depth Profiling of PS-b-PMMA Block Copolymers Using Arn+, C60++, and Cs+ Sputtering Ions
err2017-06-15
err16
PREAI
errTerlier, T.; Zappala, G.; Marie, C.; Leonard, D.; Barnes, J. -P.; Licciardello, A.
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Thin-Wall GaN/InAlN Multiple Quantum Well Tubes
err2017-05-03
err10
PREAI
errDurand, Christophe; Carlin, Jean-Francois; Bougerol, Catherine; Gayral, Bruno; Salomon, Damien; Barnes, Jean-Paul; Eymery, Joel; Butte, Raphael; Grandjean, Nicolas
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Particular structural defects in Ta2O5 from crystallisation of amorphous thin films in O2-H2O atmosphere
err2015-08-01
err0
PREAI
errLe Gallic, Marie; Roussel, Herve; Rapenne, Laetitia; Audier, Marc; Barnes, Jean-Paul
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Functionalization of Silica Nanoparticles and Native Silicon Oxide with Tailored Boron-Molecular Precursors for Efficient and Predictive p-Doping of Silicon
err2015-06-04
err28
PREAI
errMathey, Laurent; Alphazan, Thibault; Valla, Maxence; Veyre, Laurent; Fontaine, Herve; Enyedi, Virginie; Yckache, Karim; Danielou, Marianne; Kerdiles, Sebastien; Guerrero, Jean; Barnes, Jean-Paul; Veillerot, Marc; Chevalier, Nicolas; Mariolle, Denis; Bertin, Francois; Durand, Corentin; Berthe, Maxime; Dendooven, Jolien; Martin, Francois; Thieuleux, Chloe; Grandidier, Bruno; Coperet, Christophe
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Three dimensional imaging and analysis of a single nano-device at the ultimate scale using correlative microscopy techniques
err2015-05-26
err30
PREAI
errGrenier, A.; Duguay, S.; Barnes, J. P.; Serra, R.; Rolland, N.; Audoit, G.; Morin, P.; Gouraud, P.; Cooper, D.; Blavette, D.; Vurpillot, F.
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Low defect InGaAs quantum well selectively grown by metal organic chemical vapor deposition on Si(100) 300 mm wafers for next generation non planar devices
err2014-07-01
err46
errOAAI
errCipro, R.; Baron, T.; Martin, M.; Moeyaert, J.; David, S.; Gorbenko, V.; Bassani, F.; Bogumilowicz, Y.; Barnes, J. P.; Rochat, N.; Loup, V.; Vizioz, C.; Allouti, N.; Chauvin, N.; Bao, X. Y.; Ye, Z.; Pin, J. B.; Sanchez, E.
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Interface stability of thin, dense CGO film coating on YSZ for solid oxide fuel cells
err2013-03-01
err29
PREAI
errConstantin, G.; Rossignol, C.; Barnes, J. -P.; Djurado, E.
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Unifying natural and laboratory chemical weathering with interfacial dissolution-reprecipitation: A study based on the nanometer-scale chemistry of fluid-silicate interfaces
err2012-02-01
err275
errOAAI
errHellmann, Roland; Wirth, Richard; Daval, Damien; Barnes, Jean-Paul; Penisson, Jean-Michel; Tisserand, Delphine; Epicier, Thierry; Florin, Brigitte; Hervig, Richard L.
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