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Leonard Hayden

Intel Corporation

11H指数
58论文数
669被引数
收录论文 4
发表时间
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Characterizing Capacitor Top Plate Bias for More Accurate Electromagnetic Simulations
errIEEE Transactions on Semiconductor Manufacturing
IF2.3
err2025-11-01
err0
PREAI
errZampardi, Peter J.; Davenport, Quinn; Hayden, Leonard
err分享
err收藏
Evaluation and Modeling of Low Value Comb Resistors
errIEEE Transactions on Semiconductor Manufacturing
IF2.3
err2025-11-01
err0
PREAI
errZampardi, Peter J.; Davenport, Quinn; Hayden, Leonard
err分享
err收藏
ARFTG June 2013
errIEEE MICROWAVE MAGAZINE
IF2.6
err2013-05-01
err0
errOAAI
errHayden, Leonard; Grossman, Brett; Aaen, Peter H.
err分享
err收藏
The IMS2013 Technical Program Participation Is What It Is All About
errIEEE MICROWAVE MAGAZINE
IF2.6
err2013-05-01
err0
errOAAI
errHayden, Leonard; Campbell, Richard
err分享
err收藏

研究方向

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合作学者
合作期刊
P
P.J. Zampardi
H 指数: 18 · 论文数: 146
P
Peter H. Aaen
H 指数: 15 · 论文数: 126
B
Brett Grossman
H 指数: 6 · 论文数: 21
Q
Quinn Davenport
H 指数: 1 · 论文数: 2
Q
Quinn Davenport
H 指数: 1 · 论文数: 2
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