Jan Van Houdt - Publications, H-index & Citations

Jan Van Houdt

imec

33H指数

372论文数

4.8K被引数

收录论文 20

发表时间

A Direct-Capacitance-Conversion FeRAM Characterization Platform for Enabling Non-Destructive 3-D Ferroelectric Capacitor Readout 直接电容转换型FeRAM特性分析平台，用于实现非破坏性3-D铁电电容读出

ieee transactions on circuits and systems ii: express briefs

IF0

2026-02-26

PREAI

Xiongfei Jiang; Chaohan Wang; Yang Xiang; Shiwei Wang; Themis Prodromakis; Marie Garcia Bardon; Jan Van Houdt; Fernando Garcia Redondo; Dwaipayan Biswas

Seed layer effect on the phase evolution of the La-doped hafnium zirconium oxide with back-end-of-line compatibility 种子层效应对与后端工艺兼容的La掺杂铪锆氧化物相演变的影响

Applied Surface Science

IF6.9

2025-10-01

PREAI

Dae Seon Kwon; Jasper Bizindavyi; Pradyumna Kumar Parida; Gourab De; Hyun-Cheol Kim; Olivier Richard; Paola Favia; Attilio Belmonte; Annelies Delabie; Laura Nyns; Gouri Sankar Kar; Jan Van Houdt; Mihaela Ioana Popovici

Switching of a magnetic tunnel junction by voltage-controlled magnetic anisotropy

PHYSICAL REVIEW APPLIED

IF4.4

2025-01-21

PREAI

Favaro, D.; Kim, W.; Ranjbar, S.; Monteiro, M. Gama; Carpenter, R.; Rao, S.; Van Beek, S.; Labbate, L.; Van Houdt, J.; Temst, K.; Couet, S.

Investigation of the role of in-plane stress behavior on ferroelectric properties of scaled-up hafnium zirconium oxide superlattices 研究面内应力行为对放大尺寸的铪锆氧化物超晶格铁电性能的影响

NANOSCALE

IF5.1

2025-01-01

PREAI

De, Gourab; Popovici, Mihaela Ioana; Mukherjee, Shankha; Kwon, Dae Seon; Luciano, Federica; Murphy, Tony; Kar, Gouri Sankar; Delabie, Annelies; Van Houdt, Jan

Improvement of the Ferroelectric Response of La-Doped Hafnium Zirconium Oxide Employing Tungsten Oxide Interfacial Layer with Back-End-of-Line Compatibility

ACS APPLIED MATERIALS & INTERFACES

IF8.2

2024-07-26

PREAI

Kwon, Dae Seon; Bizindavyi, Jasper; De, Gourab; Belmonte, Attilio; Delabie, Annelies; Nyns, Laura; Kar, Gouri Sankar; Van Houdt, Jan; Popovici, Mihaela Ioana

Comprehensive Investigation of Constant Voltage Stress Time-Dependent Breakdown and Cycle-to-Breakdown Reliability in Y-Doped and Si-Doped HfO2 Metal-Ferroelectric-Metal Memory

NANOMATERIALS

IF4.3

2023-07-19

OAAI

Chang, Ting-Yu; Wang, Kuan-Chi; Liu, Hsien-Yang; Hseun, Jing-Hua; Peng, Wei-Cheng; Ronchi, Nicolo; Celano, Umberto; Banerjee, Kaustuv; Van Houdt, Jan; Wu, Tian-Li

High-Endurance Ferroelectric (La, Y) and (La, Gd) Co-Doped Hafnium Zirconate Grown by Atomic Layer Deposition 通过原子层沉积生长的高耐久性铁电 (La，Y) 和 (La，Gd) 共掺杂锆酸铪

ACS APPLIED ELECTRONIC MATERIALS

IF4.7

2022-04-06

OAAI

Popovici, Mihaela Ioana; Walke, Amey M.; Bizindavyi, Jasper; Meersschaut, Johan; Banerjee, Kaustuv; Potoms, Goedele; Katcko, Kostantine; Van den Bosch, Geert; Delhougne, Romain; Kar, Gouri Sankar; Van Houdt, Jan

Strain and ferroelectricity in wurtzite ScxAl1-xN materials

APPLIED PHYSICS LETTERS

IF3.6

2021-10-28

PREAI

Clima, Sergiu; Pashartis, Christopher; Bizindavyi, Jasper; McMitchell, Sean R. C.; Houssa, Michel; Van Houdt, Jan; Pourtois, Geoffrey

Impact of ambient temperature on the switching of voltage-controlled perpendicular magnetic tunnel junction

APPLIED PHYSICS LETTERS

IF3.6

2021-03-23

PREAI

Wu, Y. C.; Kim, W.; Van Beek, S.; Couet, S.; Carpenter, R.; Rao, S.; Kundu, S.; Van Houdt, J.; Groeseneken, G.; Crotti, D.; Kar, G. S.

Elucidating possible crystallographic origins of wake-up mechanisms in ferroelectric hafnia

APPLIED PHYSICS LETTERS

IF3.6

2021-03-02

OAAI

McMitchell, Sean R. C.; Clima, Sergiu; Ronchi, Nicolo'; Banerjee, Kaustuv; Celano, Umberto; Popovici, Mihaela; Di Piazza, Luca; Van den Bosch, Geert; Van Houdt, Jan

Identifying alternative ferroelectric materials beyond Hf(Zr)O2

APPLIED PHYSICS LETTERS

IF3.6

2020-12-28

OAAI

Guo, Jing; Clima, Sergiu; Pourtois, Geoffrey; Van Houdt, Jan

Defect profiling in FEFET Si:HfO2 layers

APPLIED PHYSICS LETTERS

IF3.6

2020-11-17

OAAI

O'Sullivan, B. J.; Putcha, V; Izmailov, R.; Afanas'ev, V; Simoen, E.; Jung, T.; Higashi, Y.; Degraeve, R.; Truijen, B.; Kaczer, B.; Ronchi, N.; McMitchell, S.; Banerjee, K.; Clima, S.; Breuil, L.; Van den Bosch, G.; Linten, D.; Van Houdt, J.

Ferroelectricity in Si-Doped Hafnia: Probing Challenges in Absence of Screening Charges 掺杂硅的哈夫尼亚中的铁电性: 在没有筛选电荷的情况下探测挑战

NANOMATERIALS

IF4.3

2020-08-11

OAAI

Celano, Umberto; Gomez, Andres; Piedimonte, Paola; Neumayer, Sabine; Collins, Liam; Popovici, Mihaela; Florent, Karine; McMitchell, Sean R. C.; Favia, Paola; Drijbooms, Chris; Bender, Hugo; Paredis, Kristof; Di Piazza, Luca; Jesse, Stephen; Van Houdt, Jan; van der Heide, Paul

Positive non-linear capacitance: the origin of the steep subthreshold-slope in ferroelectric FETs

SCIENTIFIC REPORTS

IF3.9

2019-10-18

OAAI

Alam, Md Nur K.; Roussel, P.; Heyns, M.; Van Houdt, J.

The flexoelectric effect in Al-doped hafnium oxide

NANOSCALE

IF5.1

2018-01-01

PREAI

Celano, Umberto; Popovici, Mihaela; Florent, Karine; Lavizzari, Simone; Favia, Paola; Paulussen, Kris; Bender, Hugo; di Piazza, Luca; Van Houdt, Jan; Vandervorst, Wilfried

Evidences for vertical charge dipole formation in charge-trapping memories and its impact on reliability

APPLIED PHYSICS LETTERS

IF3.6

2012-07-30

PREAI

Padovani, Andrea; Arreghini, Antonio; Vandelli, Luca; Larcher, Luca; Van den Bosch, Geert; Van Houdt, Jan

Lanthanide Aluminates as Dielectrics for Non-Volatile Memory Applications: Material Aspects

JOURNAL OF THE ELECTROCHEMICAL SOCIETY

IF3.3

2011-06-09

PREAI

Adelmann, C.; Swerts, J.; Richard, O.; Conard, T.; Popovici, M.; Meersschaut, J.; Afanas'ev, V. V.; Breuil, L.; Cacciato, A.; Opsomer, K.; Brijs, B.; Tielens, H.; Pourtois, G.; Bender, H.; Jurczak, M.; Van Houdt, J.; Van Elshocht, S.; Kittl, J. A.

First-principles modeling of intrinsic and extrinsic defects in γ-Al2O3

APPLIED PHYSICS LETTERS

IF3.6

2010-11-24

OAAI

Sankaran, K.; Pourtois, G.; Degraeve, R.; Zahid, M. B.; Rignanese, G. -M.; Van Houdt, J.

Profiling of traps in SiO2/Al2O3 gate stack by the charge pumping technique

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

IF4.6

2006-12-01

PREAI

Crupi, Isodiana; Degraeve, Robin; Govoreanu, Bogdan; Brunco, David P.; Roussel, Philippe; Van Houdt, Jan