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A. Yu. Belov

Paul Drude Institute for Solid State Electronics

14H指数
50论文数
596被引数
收录论文 13
发表时间
Experimental Relaxation Volume of Al Impurity in Si(Al) Thermomigrated Structures
err2025-03-01
err0
PREAI
errLomov, Andrey A.; Belov, Alexander Yu.; Punegov, Vasily I.; Seredin, Boris M.; Simakin, Sergey G.
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Evolution of sp2 networks with substrate temperature in amorphous carbon films:: Experiment and theory -: art. no. 014120
err2005-07-20
err68
PREAI
errGago, R; Vinnichenko, M; Jäger, HU; Belov, AY; Jiménez, I; Huang, N; Sun, H; Maitz, MF
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Molecular dynamics modelling of silicon wafer bonding
err1997-12-01
err6
PREAI
errScheerschmidt, K; Conrad, D; Belov, A; Gosele, U
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