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Y. H. Dai

nanjing university of posts and telecommunications

13H指数
33论文数
3.0K被引数
收录论文 4
发表时间
Comprehensive Investigation on Degradation of SiC SBD-Embedded MOSFET Under Repetitive UIS StressSiC SBD嵌入式MOSFET在重复UIS应力下的退化综合研究
err2026-07-31
err0
PREAI
errZiwei Hu; Jiafei Yao; Fan Yang; Yuxuan Dai; Zijing Yue; Jie Long; Jing Chen; Jing Wang; Man Li; Kemeng Yang; Zhikuang Cai; Yufeng Guo
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Supply Constraints Analysis for Bus Operations Based on Multisource Data
err2025-11-01
err0
PREAI
errZhou, Xuemei; Zhao, Xiaochi; Zhang, Yunbo; Dai, Yongqi; Xu, Ao
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A Cross-Scale Electrothermal Co-Simulation Approach for Power MOSFETs at Device-Package-Heatsink-Board Levels器件封装散热板级功率mosfet的跨尺度电热协同仿真方法
err2024-10-31
err1
errOAAI
errDai, Yuxuan; Yao, Jiafei; Chen, Jing; Qian, Qingyou; Zhang, Maolin; Zhang, Jun; Yao, Qing; Huang, Chenyang; Sun, Mingshun; Guo, Yufeng
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