Javier León - Publications, H-index & Citations

Javier León

consejo superior de investigaciones cientificas (csic)

9H指数

26论文数

283被引数

收录论文 11

发表时间

Local Thermal Resistance Extraction in Monolithic Microwave Integrated Circuits

IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS

IF7.2

2021-12-01

OAAI

Vellvehi, Miquel; Perpina, Xavier; Leon, Javier; Avino-Salvado, Oriol; Ferrer, Conrad; Jorda, Xavier

Output Power and Gain Monitoring in RF CMOS Class A Power Amplifiers by Thermal Imaging

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2019-08-01

OAAI

Perpina, Xavier; Reverter, Ferran; Leon, Javier; Barajas, Enrique; Vellvehi, Miquel; Jorda, Xavier; Altet, Josep

Single-MOSFET DC thermal sensor for RF-amplifier central frequency extraction 用于射频放大器中心频率提取的单MOSFET直流热传感器

SENSORS AND ACTUATORS A-PHYSICAL

IF4.9

2017-09-01

OAAI

Reverter, Ferran; Perpina, Xavier; Barajas, Enrique; Leon, Javier; Vellvehi, Miguel; Jorda, Xavier; Altet, Josep

Thermal phase lag heterodyne infrared imaging for current tracking in radio frequency integrated circuits

APPLIED PHYSICS LETTERS

IF3.6

2017-02-27

OAAI

Perpina, X.; Leon, J.; Altet, J.; Vellvehi, M.; Reverter, F.; Barajas, E.; Jorda, X.

MOSFET dynamic thermal sensor for IC testing applications

SENSORS AND ACTUATORS A-PHYSICAL

IF4.9

2016-05-01

OAAI

Reverter, Ferran; Perpina, Xavier; Barajas, Enrique; Leon, Javier; Vellvehi, Miquel; Jorda, Xavier; Altet, Josep

Functional and Consumption Analysis of Integrated Circuits Supplied by Inductive Power Transfer by Powering Modulation and Lock-In Infrared Imaging

IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS

IF7.2

2015-12-01

PREAI

Leon, Javier; Perpina, Xavier; Sacristan, Jordi; Vellvehi, Miquel; Baldi, Antonio; Jorda, Xavier

Small signal thermal analysis of local multibarrier behaviour in SiC Schottky diodes

JOURNAL OF PHYSICS D-APPLIED PHYSICS

IF3.2

2014-08-22

PREAI

Leon, J.; Perpina, X.; Vellvehi, M.; Jorda, X.; Berthou, M.; Godignon, P.

Structural analysis of SiC Schottky diodes failure mechanism under current overload

JOURNAL OF PHYSICS D-APPLIED PHYSICS

IF3.2

2013-12-31

PREAI

Leon, J.; Berthou, M.; Perpina, X.; Banu, V.; Montserrat, J.; Vellvehi, M.; Godignon, P.; Jorda, X.

Physically based analysis of electrical frequency response of passive microelectronic circuits by heterodyne lock-in thermal means

JOURNAL OF PHYSICS D-APPLIED PHYSICS

IF3.2

2013-10-17

PREAI

Leon, J.; Perpina, X.; Altet, J.; Vellvehi, M.; Jorda, X.

Wireless pad-free integrated circuit debugging by powering modulation and lock-in infrared sensing

APPLIED PHYSICS LETTERS

IF3.6

2013-02-27

PREAI

Leon, J.; Perpina, X.; Vellvehi, M.; Baldi, A.; Sacristan, J.; Jorda, X.

Spatially and frequency-resolved monitoring of intradie capacitive coupling by heterodyne excitation infrared lock-in thermography

APPLIED PHYSICS LETTERS

IF3.6

2013-02-05

OAAI

Leon, J.; Perpina, X.; Altet, J.; Vellvehi, M.; Jorda, X.

研究方向