I. C. Noyan - Publications, H-index & Citations

I. C. Noyan

Columbia University

29H指数

204论文数

6.4K被引数

收录论文 26

发表时间

Stress measurement using area detectors: a theoretical and experimental comparison of different methods in ferritic steel using a portable X-ray apparatus

JOURNAL OF MATERIALS SCIENCE

IF3.9

2016-02-29

OAAI

Ramirez-Rico, J.; Lee, S. -Y.; Ling, J. J.; Noyan, I. C.

Determination of shape anisotropy in embedded low contrast submonolayer quantum dot structures

APPLIED PHYSICS LETTERS

IF3.6

2015-12-22

OAAI

Dhomkar, S.; Vaxelaire, N.; Ji, H.; Shuvayev, V.; Tamargo, M. C.; Kuskovsky, I. L.; Noyan, I. C.

Vertical correlation and miniband formation in submonolayer Zn(Cd)Te/ZnCdSe type-II quantum dots for intermediate band solar cell application

APPLIED PHYSICS LETTERS

IF3.6

2013-10-29

PREAI

Dhomkar, S.; Manna, U.; Noyan, I. C.; Tamargo, M. C.; Kuskovsky, I. L.

Feasibility of submonolayer ZnTe/ZnCdSe quantum dots as intermediate band solar cell material system

SOLAR ENERGY MATERIALS AND SOLAR CELLS

IF6.3

2013-10-01

PREAI

Dhomkar, S.; Manna, U.; Peng, L.; Moug, R.; Noyan, I. C.; Tamargo, M. C.; Kuskovsky, I. L.

Load Transfer and Recovery Length in Parallel Wires of Suspension Bridge Cables

engineering fracture mechanics

IF3.2

2011-04-01

PREAI

Waisman, Haim; Montoya, Arturo; Betti, Raimondo; Noyan, I. C.

Strain measured in a silicon-on-insulator, complementary metal-oxide-semiconductor device channel induced by embedded silicon-carbon source/drain regions

APPLIED PHYSICS LETTERS

IF3.6

2009-02-09

PREAI

Murray, Conal E.; Ren, Z.; Ying, A.; Polvino, S. M.; Noyan, I. C.; Cai, Z.

Synchrotron microbeam x-ray radiation damage in semiconductor layers

APPLIED PHYSICS LETTERS

IF3.6

2008-06-06

PREAI

Polvino, Sean M.; Murray, Conal E.; Kalenci, Oezgur; Noyan, I. C.; Lai, Barry; Cai, Zhoghou

Submicron mapping of strained silicon-on-insulator features induced

APPLIED PHYSICS LETTERS

IF3.6

2007-04-25

PREAI

Murray, Conal E.; Sankarapandian, M.; Polvino, S. M.; Noyan, I. C.; Lai, B.; Cai, Z.

Mapping local strain in thin film/substrate systems using x-ray microdiffraction topography

APPLIED PHYSICS LETTERS

IF3.6

2007-03-02

PREAI

Yan, Hanfei; Murray, Conal E.; Noyan, I. C.

Dynamical diffraction peak splitting in time-of-flight neutron diffraction

APPLIED PHYSICS LETTERS

IF3.6

2006-12-08

PREAI

Ustundag, E.; Karnesky, R. A.; Daymond, M. R.; Noyan, I. C.

Thermal stress evolution in embedded Cu/low-k dielectric composite features

APPLIED PHYSICS LETTERS

IF3.6

2006-07-07

PREAI

Murray, Conal E.; Goldsmith, Charles C.; Shaw, Thomas M.; Doyle, James P.; Noyan, I. C.

Mechanism for increasing dopant incorporation in semiconductors via doped nanostructures

PHYSICAL REVIEW B

IF3.7

2006-05-08

PREAI

Kuskovsky, Igor L.; Gu, Y.; Gong, Y.; Yan, H. F.; Lau, J.; Noyan, I. C.; Neumark, G. F.; Maksimov, O.; Zhou, X.; Tamargo, M. C.; Volkov, V.; Zhu, Y.; Wang, L.

Flexural loading of rectangular Si beams and plates

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING

IF7

2005-06-01

PREAI

Kaldor, SK; Noyan, IC

Finite size effects in stress analysis of interconnect structures

APPLIED PHYSICS LETTERS

IF3.6

2004-08-02

OAAI

Noyan, IC; Murray, CE; Chey, JS; Goldsmith, CC

Mapping of strain fields about thin film structures using x-ray microdiffraction

APPLIED PHYSICS LETTERS

IF3.6

2003-11-17

PREAI

Murray, CE; Noyan, IC; Mooney, PM; Lai, B; Cai, Z

Differentiating between elastically bent rectangular beams and plates (vol 80, pg 2284, 2002)

APPLIED PHYSICS LETTERS

IF3.6

2002-06-24

OAAI

Kaldor, SK; Noyan, IC

Differentiating between elastically bent rectangular beams and plates

APPLIED PHYSICS LETTERS

IF3.6

2002-04-01

PREAI

Kaldor, SK; Noyan, IC

Real-time x-ray microbeam characterization of electromigration effects in Al(Cu) wires

APPLIED PHYSICS LETTERS

IF3.6

2001-04-30

PREAI

Wang, PC; Noyan, IC; Kaldor, SK; Jordan-Sweet, JL; Liniger, EG; Hu, CK

Quantitative metrology study of Cu/SiO2 interconnect structures using fluorescence x-ray microscopy

APPLIED PHYSICS LETTERS

IF3.6

2001-02-05

PREAI

Xu, GY; Su, X; Stagarescu, CB; Eastman, DE; Lai, B; Cai, Z; Noyan, IC; Hu, CK

Quantitative nanoscale metrology study of Cu/SiO2 interconnect technology using transmission x-ray microscopy

APPLIED PHYSICS LETTERS

IF3.6

2000-11-20

PREAI

Su, X; Stagarescu, C; Xu, G; Eastman, DE; McNulty, I; Frigo, SP; Wang, YX; Retsch, CC; Noyan, IC; Hu, CK

研究方向