arrow
返回
S

Samiul Hasan

University of South Carolina System

11H指数
33论文数
339被引数
收录论文 6
发表时间
Reduction in density of interface traps determined by C-V analysis in III-nitride-based MOSHFET structure
err2024-03-11
err2
PREAI
errHasan, Samiul; Jewel, Mohi Uddin; Crittenden, Scott R.; Zakir, Md Ghulam; Nipa, Nifat Jahan; Avrutin, Vitaliy; Ozgur, Uemit; Morkoc, Hadis; Ahmad, Iftikhar
err分享
err收藏
Valence-band characterization of AgGaSe2 thin films
err2008-11-13
err9
PREAI
errBhuiyan, M. R. A.; Rahman, M. K.; Hasan, S. M. Firoz
err分享
err收藏