Ichiro Yonenaga - Publications, H-index & Citations

Ichiro Yonenaga

tohoku university

36H指数

376论文数

5.5K被引数

收录论文 40

发表时间

Growth of tin-doped Ge crystals: A comparison of impurity segregation behavior with IV element crystals and alloys 锡掺杂Ge晶体的生长：与IV族元素晶体和合金的杂质分凝行为比较

Journal of Crystal Growth

IF2

2025-12-01

PREAI

Yonenaga, Ichiro; Taishi, Toshinori; Murao, Yu; Inoue, Kaihei

Thermal equilibrium vacancies in Si crystals doped with atoms of Group III, IV, and V: determination of formation energies and entropies by a slow quenching method and their analyses Si晶体中掺杂III族、IV族和V族原子的热平衡空位：通过慢速淬火方法确定其形成能和熵及其分析

Japanese Journal of Applied Physics

IF1.8

2025-12-01

PREAI

Suezawa, Masashi; Fukata, Naoki; Yonenaga, Ichiro

Mechanism of SiC formation by Si surface carbonization using CO gas

APPLIED SURFACE SCIENCE

IF6.9

2024-07-01

PREAI

Deura, Momoko; Ohno, Yutaka; Yonenaga, Ichiro; Fukuyama, Hiroyuki

Study on phonon lifetime in bulk silicon-germanium through observation of acoustic phonon spectra broadening by inelastic x-ray scattering

APPLIED PHYSICS LETTERS

IF3.6

2022-08-23

PREAI

Yokogawa, Ryo; Arai, Yasutomo; Yonenaga, Ichiro; Tomita, Motohiro; Chung, Sylvia Yuk Yee; Uchiyama, Hiroshi; Watanabe, Takanobu; Ogura, Atsushi

Anomalous low energy phonon dispersion in bulk silicon-germanium observed by inelastic x-ray scattering

APPLIED PHYSICS LETTERS

IF3.6

2020-06-16

PREAI

Yokogawa, R.; Takeuchi, H.; Arai, Y.; Yonenaga, I; Tomita, M.; Uchiyama, H.; Watanabe, T.; Ogura, A.

Upper yield stress of Si crystals at high temperatures

JOURNAL OF THE ELECTROCHEMICAL SOCIETY

IF3.3

2019-12-06

PREAI

Yonenaga, I

Impact of local atomic stress on oxygen segregation at tilt boundaries in silicon 局部原子应力对硅中倾斜边界处氧偏析的影响

APPLIED PHYSICS LETTERS

IF3.6

2017-02-07

PREAI

Ohno, Yutaka; Inoue, Kaihei; Fujiwara, Kozo; Kutsukake, Kentaro; Deura, Momoko; Yonenaga, Ichiro; Ebisawa, Naoki; Shimizu, Yasuo; Inoue, Koji; Nagai, Yasuyoshi; Yoshida, Hideto; Takeda, Seiji; Tanaka, Shingo; Kohyama, Masanori

Recombination activity of nickel, copper, and oxygen atoms segregating at grain boundaries in mono-like silicon crystals

APPLIED PHYSICS LETTERS

IF3.6

2016-10-06

PREAI

Ohno, Yutaka; Kutsukake, Kentaro; Deura, Momoko; Yonenaga, Ichiro; Shimizu, Yasuo; Ebisawa, Naoki; Inoue, Koji; Nagai, Yasuyoshi; Yoshida, Hideto; Takeda, Seiji

Three-dimensional evaluation of gettering ability for oxygen atoms at small-angle tilt boundaries in Czochralski-grown silicon crystals

APPLIED PHYSICS LETTERS

IF3.6

2015-06-23

PREAI

Ohno, Yutaka; Inoue, Kaihei; Fujiwara, Kozo; Deura, Momoko; Kutsukake, Kentaro; Yonenaga, Ichiro; Shimizu, Yasuo; Inoue, Koji; Ebisawa, Naoki; Nagai, Yasuyoshi

Nanoscopic mechanism of Cu precipitation at small-angle tilt boundaries in Si

PHYSICAL REVIEW B

IF3.7

2015-06-17

PREAI

Ohno, Yutaka; Inoue, Kaihei; Kutsukake, Kentaro; Deura, Momoko; Ohsawa, Takayuki; Yonenaga, Ichiro; Yoshida, Hideto; Takeda, Seiji; Taniguchi, Ryo; Otubo, Hideki; Nishitani, Sigeto R.; Ebisawa, Naoki; Shimizu, Yasuo; Takamizawa, Hisashi; Inoue, Koji; Nagai, Yasuyoshi

Comment on Contributions of vacancies and self-interstitials to self-diffusion in silicon under thermal equilibrium and nonequilibrium conditions

PHYSICAL REVIEW B

IF3.7

2014-09-24

PREAI

Suezawa, Masashi; Iijima, Yoshiaki; Yonenaga, Ichiro

Spectroscopic identification of shallow muonium acceptors in Si0.06Ge0.94

APPLIED PHYSICS LETTERS

IF3.6

2014-09-22

PREAI

Carroll, B. R.; Lichti, R. L.; Mengyan, P. W.; Baker, B. B.; Celebi, Y. G.; King, P. J. C.; Chow, K. H.; Yonenaga, I.

In-situ micro and near-field photo-excitation under transmission electron microscopy

APPLIED SURFACE SCIENCE

IF6.9

2014-05-01

PREAI

Ohno, Y.; Yonenaga, I.

How to best measure atomic segregation to grain boundaries by analytical transmission electron microscopy

JOURNAL OF MATERIALS SCIENCE

IF3.9

2013-12-18

PREAI

Walther, T.; Hopkinson, M.; Daneu, N.; Recnik, A.; Ohno, Y.; Inoue, K.; Yonenaga, I.

A novel constitutive model for semiconductors: The case of silicon

JOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDS

IF6

2013-12-01

PREAI

Cochard, J.; Yonenaga, I.; M'Hamdi, M.; Zhang, Z. L.

Three-dimensional evaluation of gettering ability of Σ3{111} grain boundaries in silicon by atom probe tomography combined with transmission electron microscopy

APPLIED PHYSICS LETTERS

IF3.6

2013-09-03

PREAI

Ohno, Yutaka; Inoue, Kaihei; Tokumoto, Yuki; Kutsukake, Kentaro; Yonenaga, Ichiro; Ebisawa, Naoki; Takamizawa, Hisashi; Shimizu, Yasuo; Inoue, Koji; Nagai, Yasuyoshi; Yoshida, Hideto; Takeda, Seiji

In-situ transmission electron microscopy of partial-dislocation glide in 4H-SiC under electron radiation

APPLIED PHYSICS LETTERS

IF3.6

2012-07-23

PREAI

Ohno, Yutaka; Yonenaga, Ichiro; Miyao, Kotaro; Maeda, Koji; Tsuchida, Hidekazu

Muonium defect levels in Czochralski-grown silicon-germanium alloys

PHYSICAL REVIEW B

IF3.7

2010-11-10

PREAI

Carroll, B. R.; Lichti, R. L.; King, P. J. C.; Celebi, Y. G.; Yonenaga, I.; Chow, K. H.