Jun-Sik Yoon - Publications, H-index & Citations

Jun-Sik Yoon

机构信息待补充

25H指数

98论文数

1.6K被引数

收录论文 27

发表时间

Investigation of Program Efficiency Overshoot in 3D Vertical Channel NAND Flash with Randomly Distributed Traps

NANOMATERIALS

IF4.3

2023-04-24

OAAI

Park, Chanyang; Yoon, Jun-Sik; Nam, Kihoon; Jang, Hyundong; Park, Minsang; Baek, Rock-Hyun

Quantitative analysis of irregular channel shape effects on charge-trapping efficiency using massive 3D NAND data

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

IF4.6

2023-04-01

PREAI

Park, Chanyang; Yoon, Jun-Sik; Nam, Kihoon; Jang, Hyundong; Park, Min Sang; Baek, Rock-Hyun

Holistic Optimization of Trap Distribution for Performance/Reliability in 3-D NAND Flash Using Machine Learning

IEEE ACCESS

IF3.6

2023-01-01

OAAI

Nam, Kihoon; Park, Chanyang; Yun, Hyeok; Yoon, Jun-Sik; Jang, Hyundong; Cho, Kyeongrae; Park, Min Sang; Choi, Hyun-Chul; Baek, Rock-Hyun

Sensitivity of Inner Spacer Thickness Variations for Sub-3-nm Node Silicon Nanosheet Field-Effect Transistors

NANOMATERIALS

IF4.3

2022-09-26

OAAI

Lee, Sanguk; Jeong, Jinsu; Yoon, Jun-Sik; Lee, Seunghwan; Lee, Junjong; Lim, Jaewan; Baek, Rock-Hyun

Optimal Energetic-Trap Distribution of Nano-Scaled Charge Trap Nitride for Wider Vth Window in 3D NAND Flash Using a Machine-Learning Method

NANOMATERIALS

IF4.3

2022-05-25

OAAI

Nam, Kihoon; Park, Chanyang; Yoon, Jun-Sik; Yun, Hyeok; Jang, Hyundong; Cho, Kyeongrae; Kang, Ho-Jung; Park, Min-Sang; Sim, Jaesung; Choi, Hyun-Chul; Baek, Rock-Hyun

Novel Modeling Approach to Analyze Threshold Voltage Variability in Short Gate-Length (15-22 nm) Nanowire FETs with Various Channel Diameters

NANOMATERIALS

IF4.3

2022-05-18

OAAI

Lee, Seunghwan; Yoon, Jun-Sik; Lee, Junjong; Jeong, Jinsu; Yun, Hyeok; Lim, Jaewan; Lee, Sanguk; Baek, Rock-Hyun

Extraction of Device Structural Parameters Through DC/AC Performance Using an MLP Neural Network Algorithm

IEEE ACCESS

IF3.6

2022-01-01

OAAI

Jang, Hyundong; Yun, Hyeok; Park, Chanyang; Cho, Kyeongrae; Nam, Kihoon; Yoon, Jun-Sik; Choi, Hyun-Chul; Baek, Rock-Hyun

DC Performance Variations by Grain Boundary in Source/Drain Epitaxy of Sub-3-nm Nanosheet Field-Effect Transistors

IEEE ACCESS

IF3.6

2022-01-01

OAAI

Yoon, Jun-Sik; Jeong, Jinsu; Lee, Seunghwan; Lee, Junjong; Lee, Sanguk; Lim, Jaewan; Baek, Rock-Hyun

Analysis of TSV-Induced Mechanical Stress and Electrical Noise Coupling in Sub 5-nm Node Nanosheet FETs for Heterogeneous 3D-ICs

IEEE ACCESS

IF3.6

2021-01-01

OAAI

Jeong, Jinsu; Yoon, Jun-Sik; Baek, Rock-Hyun

Digital/Analog Performance Optimization of Vertical Nanowire FETs Using Machine Learning

IEEE ACCESS

IF3.6

2021-01-01

OAAI

Yoon, Jun-Sik; Lee, Seunghwan; Yun, Hyeok; Baek, Rock-Hyun

Monolithic 3D 6T-SRAM Based on Newly Designed Gate and Source/Drain Bottom Contact Schemes

IEEE ACCESS

IF3.6

2021-01-01

OAAI

Lee, Junjong; Yoon, Jun-Sik; Jeong, Jinsu; Lee, Seunghwan; Lee, Sanguk; Baek, Rock-Hyun

Comprehensive Analysis of Source and Drain Recess Depth Variations on Silicon Nanosheet FETs for Sub 5-nm Node SoC Application

IEEE ACCESS

IF3.6

2020-01-01

OAAI

Jeong, Jinsu; Yoon, Jun-Sik; Lee, Seunghwan; Baek, Rock-Hyun

Neural Approach for Modeling and Optimizing Si-MOSFET Manufacturing

IEEE ACCESS

IF3.6

2020-01-01

OAAI

Choi, Hyun-Chul; Yun, Hyeok; Yoon, Jun-Sik; Baek, Rock-Hyun

A Novel Sub-5-nm Node Dual-Workfunction Folded Cascode Nanosheet FETs for Low Power Mobile Applications

IEEE ACCESS

IF3.6

2020-01-01

OAAI

Yoon, Jun-Sik; Baek, Rock-Hyun

Device Design Guideline of 5-nm-Node FinFETs and Nanosheet FETs for Analog/RF Applications

IEEE ACCESS

IF3.6

2020-01-01

OAAI

Yoon, Jun-Sik; Baek, Rock-Hyun

Punch-Through-Stopper Free Nanosheet FETs With Crescent Inner-Spacer and Isolated Source/Drain

IEEE ACCESS

IF3.6

2019-01-01

OAAI

Yoon, Jun-Sik; Jeong, Jinsu; Lee, Seunghwan; Baek, Rock-Hyun

Source/Drain Patterning FinFETs as Solution for Physical Area Scaling Toward 5-nm Node

IEEE ACCESS

IF3.6

2019-01-01

OAAI

Yoon, Jun-Sik; Lee, Seunghwan; Lee, Junjong; Jeong, Jinsu; Yun, Hyeok; Kang, Bohyeon; Baek, Rock-Hyun

Bottom oxide Bulk FinFETs Without Punch-Through-Stopper for Extending Toward 5-nm Node

IEEE ACCESS

IF3.6

2019-01-01

OAAI

Yoon, Jun-Sik; Jeong, Jinsu; Lee, Seunghwan; Baek, Rock-Hyun

Electron trapping and extraction kinetics on carrier diffusion in metal halide perovskite thin films

JOURNAL OF MATERIALS CHEMISTRY A

IF9.5

2019-01-01

PREAI

Kang, Gyeongho; Yoon, Jun-Sik; Kim, Guan-Woo; Choi, Kyoungwon; Park, Taiho; Baek, Rock-Hyun; Lim, Jongchul

An array of metal oxides nanoscale hetero p-n junctions toward designable and highly-selective gas sensors

SENSORS AND ACTUATORS B-CHEMICAL

IF7.7

2018-02-01

PREAI

Kwon, Hyunah; Yoon, Jun-Sik; Lee, Yuna; Kim, Dong Yeong; Baek, Chang-Ki; Kim, Jong Kyu

研究方向