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B

Bhanu Teja Vankayalapati

University of Texas Dallas

13H指数
26论文数
524被引数
收录论文 13
发表时间
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Switching Transient-Based Junction Temperature Estimation of SiC MOSFETs With Aging Compensation
errIEEE TRANSACTIONS ON POWER ELECTRONICS
IF6.5
err2024-10-01
err0
PREAI
errFarhadi, Masoud; Sajadi, Rahman; Vankayalapati, Bhanu Teja; Akin, Bilal
err分享
err收藏
Model Based Junction Temperature Profile Control of SiC MOSFETs in DC Power Cycling for Accurate Reliability Assessments
errIEEE TRANSACTIONS ON INDUSTRY APPLICATIONS
IF4.5
err2024-09-01
err0
PREAI
errVankayalapati, Bhanu Teja; Sajadi, Rahman; Ajmal, Muhammed C. N.; Deshmukh, Akshay Vijayrao; Farhadi, Masoud; Akin, Bilal
err分享
err收藏
Gate-Oxide Degradation Monitoring of SiC MOSFETs Based on Transfer Characteristic With Temperature Compensation
errIEEE TRANSACTIONS ON TRANSPORTATION ELECTRIFICATION
IF8.3
err2024-03-01
err4
PREAI
errFarhadi, Masoud; Vankayalapati, Bhanu Teja; Sajadi, Rahman; Akin, Bilal
err分享
err收藏
AC Power Cycling Test Setup and Condition Monitoring Tools for SiC-Based Traction Inverters
errIEEE TRANSACTIONS ON VEHICULAR TECHNOLOGY
IF7.1
err2023-10-01
err11
errOAAI
errFarhadi, Masoud; Vankayalapati, Bhanu Teja; Sajadi, Rahman; Akin, Bilal
err分享
err收藏
Analysis and Compensation of Sigma-Delta ADC Latency for High Performance Motor Control and Diagnosis
errIEEE TRANSACTIONS ON INDUSTRY APPLICATIONS
IF4.5
err2023-01-01
err1
PREAI
errLi, Chen; Vankayalapati, Bhanu Teja; Akin, Bilal; Yu, Zhenyu
err分享
err收藏
A Reconfigurable AC Power Cycling Test Setup for Comprehensive Reliability Evaluation of GaN HEMTs用于GaN hemt综合可靠性评估的可重构交流功率循环测试装置
errIEEE TRANSACTIONS ON INDUSTRY APPLICATIONS
IF4.5
err2023-01-01
err3
PREAI
errXu, Chi; Vankayalapati, Bhanu Teja; Yang, Fei; Akin, Bilal
err分享
err收藏
A Comparative Study on Reliability and Ruggedness of Kelvin and Non-Kelvin Packaged SiC MOSFETs
errIEEE TRANSACTIONS ON INDUSTRY APPLICATIONS
IF4.5
err2022-05-01
err13
errOAAI
errPu, Shi; Yang, Fei; Zhang, Nathan; Vankayalapati, Bhanu Teja; Akin, Bilal
err分享
err收藏
Investigation and On-Board Detection of Gate-Open Failure in SiC MOSFETsSiC mosfet栅极开路故障的研究和车载检测
errIEEE TRANSACTIONS ON POWER ELECTRONICS
IF6.5
err2022-04-01
err11
PREAI
errVankayalapati, Bhanu Teja; Pu, Shi; Yang, Fei; Farhadi, Masoud; Gurusamy, Vigneshwaran; Akin, Bilal
err分享
err收藏
GaN-Based Multiple Output Flyback Converter With Independently Controlled Outputs
errIEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
IF7.2
err2022-03-01
err0
PREAI
errSarkar, Arnab; Vankayalapati, Bhanu Teja; Anand, Sandeep
err分享
err收藏
Temperature-Independent Gate-Oxide Degradation Monitoring of SiC MOSFETs Based on Junction Capacitances
errIEEE TRANSACTIONS ON POWER ELECTRONICS
IF6.5
err2021-07-01
err50
PREAI
errFarhadi, Masoud; Yang, Fei; Pu, Shi; Vankayalapati, Bhanu Teja; Akin, Bilal
err分享
err收藏
A Practical On-Board SiC MOSFET Condition Monitoring Technique for Aging Detection
errIEEE TRANSACTIONS ON INDUSTRY APPLICATIONS
IF4.5
err2020-05-01
err43
errOAAI
errPu, Shi; Yang, Fei; Vankayalapati, Bhanu Teja; Ugur, Enes; Xu, Chi; Akin, Bilal
err分享
err收藏
A Reconfigurable On-Board Power Converter for Electric Vehicle With Reduced Switch Count
errIEEE TRANSACTIONS ON VEHICULAR TECHNOLOGY
IF7.1
err2020-04-01
err20
PREAI
errMeher, Soumya Ranjan; Banerjee, Somenath; Vankayalapati, Bhanu Teja; Singh, Rajeev Kumar
err分享
err收藏
Two Stage Integrated On-Board Charger for EVs
err2018 IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL TECHNOLOGY (ICIT)
IF0
err2018-02-01
err3
PREAI
errVankayalapati, Bhanu Teja; Singh, Rajeev; Bussa, Vinod Kumar
err分享
err收藏

研究方向

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合作学者
合作期刊
B
Bilal Akin
H 指数: 47 · 论文数: 257
S
Sandeep Anand
H 指数: 26 · 论文数: 131
Z
Zhenyu Yu
H 指数: 26 · 论文数: 137
F
Fei Yang
H 指数: 24 · 论文数: 165
R
Rajeev Kumar Singh
H 指数: 21 · 论文数: 187
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