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H
Hyuck‐In Kwon
chung-ang university
29
H指数
163
论文数
3.3K
被引数
0
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40
发表时间
发表时间
IF
被引数
Lateral distribution of electrical defect concentration in SA TG coplanar IGZO TFTs extracted via low frequency noise analysis
通过低频噪声分析提取的SA TG共面IGZO TFTs中电学缺陷浓度的横向分布
Scientific Reports
IF
3.9
2026-06-21
0
OA
AI
Dong-Ho Lee; Jin-Ha Hwang; Chae-Eun Oh; Jihee Ryu; Jae-Man Jang; Byung-Du Ahn; Jong-Uk Bae; Hyuck-In Kwon
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Vacancy-modulated vertical heterojunction for high-performance self-driven photodetectors
空位调控的垂直异质结用于高性能自驱动光电探测器
Chemical Engineering Journal
IF
13.2
2025-09-18
0
PRE
AI
Go-Eun Kim; Mi-Jeong Kim; Tae In Kim; Hyuck-In Kwon; Ick-Joon Park
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Strategic Defect Engineering at the Buried Interface for Metal-Halide Transistors
金属-卤化物晶体管中埋层界面的战略缺陷工程
Mater. Horiz.
IF
10.7
2025-08-14
0
PRE
AI
Hyo-Won Jang; Go-Eun Kim; Mi-Jeong Kim; Joong Bum Rhim; Tae In Kim; Hyuck-In Kwon; Ick-Joon Park
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Surface crystallization effects on tellurium oxide thin films for low-power complementary logic circuit applications
APPLIED SURFACE SCIENCE
IF
6.9
2024-10-01
3
PRE
AI
Lee, Joon-Young; Kim, Tae In; Kwon, Hyuck-In; Park, Ick-Joon
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Strain modulation effects on two-dimensional tellurium for advanced p-type transistor applications
用于高级p型晶体管应用的二维碲的应变调制效应
APPLIED SURFACE SCIENCE
IF
6.9
2024-04-01
3
PRE
AI
Oh, Jong-Sang; Kim, Tae In; Kwon, Hyuck-In; Park, Ick-Joon
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Band alignment of γ-phase CuI/high-k Al2O3 heterointerface by X-ray photoelectron spectroscopy
SURFACES AND INTERFACES
IF
6.3
2024-03-01
3
PRE
AI
Kim, Tae In; Lee, Hyun-Ah; Kwon, Hyuck-In; Park, Ick-Joon
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Effects of solution processable CuI thin films with Al2O3-based sandwiched architecture for high-performance p-type transistor applications
JOURNAL OF MATERIALS CHEMISTRY C
IF
5.1
2024-01-01
2
PRE
AI
Lee, Hyun-Ah; Kim, Tae In; Kwon, Hyuck-In; Park, Ick-Joon
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Synthesis of a Tellurium Semiconductor with an Organic-Inorganic Hybrid Passivation Layer for High-Performance p-Type Thin Film Transistors
用于高性能p型薄膜晶体管的具有有机-无机杂化钝化层的碲半导体的合成
ACS APPLIED ELECTRONIC MATERIALS
IF
4.7
2023-08-16
12
PRE
AI
Lim, Seung-Hyun; Kim, Tae In; Park, Ick-Joon; Kwon, Hyuck-In
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Effects of High-Energy X-ray Irradiation on the Electrical and Chemical Properties of In-Ga-Sn-O Thin Films with Al2O3 Passivation Layer for Thin-Film Transistor Applications
高能x射线辐照对用于薄膜晶体管应用的具有Al2O3钝化层的in-ga-sn-o薄膜的电学和化学性质的影响
ACS APPLIED ELECTRONIC MATERIALS
IF
4.7
2023-04-24
7
PRE
AI
Yatsu, Kie; Lee, Hyun-Ah; Park, Ick-Joon; Kwon, Hyuck-In
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Effects of rapid thermal annealing temperature on NO2 gas sensing properties of p-type mixed phase tin oxide thin films
CERAMICS INTERNATIONAL
IF
5.6
2023-03-01
1
PRE
AI
Lim, Seung-Hyun; Park, Ick-Joon; Kwon, Hyuck-In
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Synthesis of Vacancy-Controlled Copper Iodide Semiconductor for High-Performance p-Type Thin-Film Transistors
用于高性能p型薄膜晶体管的空位控制碘化铜半导体的合成
ACS APPLIED MATERIALS & INTERFACES
IF
8.2
2022-12-12
12
PRE
AI
Lee, Hyun-Ah; Yatsu, Kie; Kim, Tae In; Kwon, Hyuck-In; Park, Ick-Joon
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One-pot hydrothermal growth of indium oxide-CNT heterostructure via single walled carbon nanotube scaffolds and their application toward flexible NO2 gas sensors
JOURNAL OF ALLOYS AND COMPOUNDS
IF
6.3
2022-11-01
15
PRE
AI
Seo, Seung Gi; Baek, Jong Ik; Mishra, Dhananjay; Jo, Hyunbin; Kwon, Hyuck-In; Jin, Sung Hun
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Addition of Low-Molecular-Weight Batches Enhances Charge- Transport Properties of n-Type Polymer Semiconductors
MACROMOLECULES
IF
5.2
2022-10-05
6
PRE
AI
Kim, Donguk; Park, Hyeonjung; Kim, Taemin; Lee, Jin-Woo; Jeong, Dahyun; Kwon, Hyuck-In; Kim, Bumjoon J.; Kim, Felix Sunjoo
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Effects of hydrogen plasma treatment on the physical and chemical properties of tin oxide thin films for ambipolar thin-film transistor applications
CERAMICS INTERNATIONAL
IF
5.6
2022-09-01
5
OA
AI
Bae, Kang-Hwan; Lim, Seung-Hyun; Yatsu, Kie; Park, Ick-Joon; Kwon, Hyuck-In
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Highly Stable Oxide Thin-Film Transistor-Based Complementary Logic Circuits under X-ray Irradiation
X射线辐照下基于高稳定氧化物薄膜晶体管的互补逻辑电路
ACS APPLIED ELECTRONIC MATERIALS
IF
4.7
2022-07-07
10
PRE
AI
Yatsu, Kie; Lee, Hyun-Ah; Kim, Dae Hwan; Park, Ick-Joon; Kwon, Hyuck-In
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Effects of Al2O3 surface passivation on the radiation hardness of IGTO thin films for thin-film transistor applications
APPLIED SURFACE SCIENCE
IF
6.9
2022-03-01
24
PRE
AI
Hwang, Seong-Hyun; Yatsu, Kie; Lee, Dong-Ho; Park, Ick-Joon; Kwon, Hyuck-In
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Wheatstone bridge based offset cancelling method utilizing a JFET as a voltage-controlled resistor
MEASUREMENT
IF
5.6
2021-12-01
2
PRE
AI
Cha, Hyun-Seok; Hwang, Seong-Hyun; Kim, Dae-Hwan; Kwon, Hyuck-In; Song, Sang-Hun
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Effects of proton beam irradiation on the physical and chemical properties of IGTO thin films with different thicknesses for thin-film transistor applications
SURFACES AND INTERFACES
IF
6.3
2021-04-01
28
PRE
AI
Shin, Min-Gyu; Hwang, Seong-Hyun; Cha, Hyun-Seok; Jeong, Hwan-Seok; Kim, Dae-Hwan; Kwon, Hyuck-In
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Effects of Capping Layers with Different Metals on Electrical Performance and Stability of p-Channel SnO Thin-Film Transistors
MICROMACHINES
IF
3
2020-09-30
8
OA
AI
Shin, Min-Gyu; Bae, Kang-Hwan; Jeong, Hwan-Seok; Kim, Dae-Hwan; Cha, Hyun-Seok; Kwon, Hyuck-In
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Floating Ni Capping for High-Mobility p-Channel SnO Thin-Film Transistors
MATERIALS
IF
3.2
2020-07-08
9
OA
AI
Shin, Min-Gyu; Bae, Kang-Hwan; Cha, Hyun-Seok; Jeong, Hwan-Seok; Kim, Dae-Hwan; Kwon, Hyuck-In
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研究方向
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合作学者
合作期刊
B
Bumjoon J. Kim
H 指数: 89 · 论文数: 679
S
Sung Kyu Park
H 指数: 58 · 论文数: 364
D
Do Kyung Hwang
H 指数: 50 · 论文数: 247
Y
Yong‐Hoon Kim
H 指数: 48 · 论文数: 371
B
Byung‐Gook Park
H 指数: 46 · 论文数: 865
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