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A

Alberto Santarelli

university of bologna

24H指数
206论文数
1.8K被引数
收录论文 11
发表时间
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Behavioral Modeling of GaN MMIC Varactors for Tunable Matching NetworksGaN MMIC变容管的开关行为建模研究
errIEEE Microwave Magazine
IF2.6
err2026-01-01
err0
PREAI
errCangini, Simone; Angelotti, Alberto Maria; Gibiino, Gian Piero; Florian, Corrado; Santarelli, Alberto
err分享
err收藏
Broadband Measurement of Error Vector Magnitude for Microwave Vector Signal Generators Using a Vector Network Analyzer
errIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
IF5.9
err2022-01-01
err7
errOAAI
errAngelotti, Alberto Maria; Gibiino, Gian Piero; Santarelli, Alberto; Traverso, Pier Andrea
err分享
err收藏
Error vector magnitude measurement for power amplifiers under wideband load impedance mismatch: System-level analysis and VNA-based implementation
errMEASUREMENT
IF5.6
err2022-01-01
err8
PREAI
errGibiino, Gian Piero; Angelotti, Alberto M.; Santarelli, Alberto; Traverso, Pier Andrea
err分享
err收藏
Pulsed techniques for the characterization of low-frequency dispersive effects in RF power FETs using a flexible measurement set-up
errMEASUREMENT
IF5.6
err2021-05-01
err3
PREAI
errGibiino, Gian Piero; Santarelli, Alberto; Traverso, Pier Andrea
err分享
err收藏
Multitone Multiharmonic Scattering Parameters for the Characterization of Nonlinear Networks用于表征非线性网络的多音多谐波散射参数
errIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
IF5.9
err2021-01-01
err5
PREAI
errGibiino, Gian Piero; Angelotti, Alberto Maria; Santarelli, Alberto; Filicori, Fabio; Traverso, Pier Andrea
err分享
err收藏
Dynamic RON Characterization Technique for the Evaluation of Thermal and OFF-State Voltage Stress of GaN Switches
errIEEE TRANSACTIONS ON POWER ELECTRONICS
IF6.5
err2018-04-01
err37
errOAAI
errCappello, Tommaso; Santarelli, Alberto; Florian, Corrado
err分享
err收藏
An Active Bias Network for the Characterization of Low-Frequency Dispersion in High-Power Microwave Electron Devices用于表征高功率微波电子器件中低频色散的有源偏置网络
errIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
IF5.9
err2013-10-01
err7
PREAI
errFlorian, Corrado; Traverso, Pier Andrea; Santarelli, Alberto; Filicori, Fabio
err分享
err收藏
A dual-source nonlinear measurement system oriented to the empirical characterization of low-frequency dispersion in microwave electron devices
errCOMPUTER STANDARDS & INTERFACES
IF3.1
err2011-02-01
err2
PREAI
errRaffo, Antonio; Vadala, Valeria; Traverso, Pier Andrea; Santarelli, Alberto; Vannini, Giorgio; Filicori, Fabio
err分享
err收藏
An Automated Measurement System for the Characterization of Electron Device Degradation Under Nonlinear Dynamic Regime
errIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
IF5.9
err2009-08-01
err7
PREAI
errRaffo, Antonio; Di Giacomo, Valeria; Traverso, Pier Andrea; Santarelli, Alberto; Vannini, Giorgio
err分享
err收藏
Automated microwave-device characterization setup based on a technology-independent generalized bias system
errIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
IF5.9
err2006-08-01
err2
errOAAI
errTraverso, Pier Andrea; Raffo, Antonio; Pirazzini, Massimo; Santarelli, Alberto; Filicori, Fabio
err分享
err收藏
A new technique for thermal resistance measurement in power electron devices
errIEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
IF5.9
err2005-10-01
err5
errOAAI
errFilicori, F; Rinaldi, P; Vannini, G; Santarelli, A
err分享
err收藏

研究方向

暂时未获取到该数据
合作学者
合作期刊
G
G. Vannini
H 指数: 32 · 论文数: 311
A
Antonio Raffo
H 指数: 29 · 论文数: 239
F
F. Filicori
H 指数: 27 · 论文数: 235
P
Pier Andrea Traverso
H 指数: 22 · 论文数: 140
C
Corrado Florian
H 指数: 21 · 论文数: 112
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