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Origin of defect luminescence in ultraviolet emitting AlGaN diode structures Feneberg, Martin; Romero, Fatima; Goldhahn, Rudiger; Wernicke, Tim; Reich, Christoph; Stellmach, Joachim; Mehnke, Frank; Knauer, Arne; Weyers, Markus; Kneissl, Michael 分享 收藏
Physics-Based Analytical Model for Input, Output, and Reverse Capacitance of a GaN HEMT With the Field-Plate Structure Cucak, Dejana; Vasic, Miroslav; Garcia, Oscar; Angel Oliver, Jesus; Alou, Pedro; Antonio Cobos, Jose; Wang, Ashu; Martin-Horcajo, Sara; Fatima Romero, Maria; Calle, Fernando 分享 收藏
Stimulated emission via electron-hole plasma recombination in fully strained single InGaN/GaN heterostructures Minj, A.; Romero, M. F.; Wang, Y.; Tuna, Oe.; Feneberg, M.; Goldhahn, R.; Schmerber, G.; Ruterana, P.; Giesen, C.; Heuken, M. 分享 收藏
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Direct comparison of traps in InAlN/GaN and AlGaN/GaN high electron mobility transistors using constant drain current deep level transient spectroscopy Sasikumar, A.; Arehart, A. R.; Martin-Horcajo, S.; Romero, M. F.; Pei, Y.; Brown, D.; Recht, F.; di Forte-Poisson, M. A.; Calle, F.; Tadjer, M. J.; Keller, S.; DenBaars, S. P.; Mishra, U. K.; Ringel, S. A. 分享 收藏
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