Sounkalo Dembélé - Publications, H-index & Citations

Sounkalo Dembélé

centre national de la recherche scientifique (cnrs)

11H指数

53论文数

383被引数

收录论文 8

发表时间

A novel adaptive noise model selection framework for blind denoising of Scanning Electron Microscopy images 一种用于扫描电镜图像盲去噪的自适应噪声模型选择框架

ENGINEERING APPLICATIONS OF ARTIFICIAL INTELLIGENCE

IF8

2025-05-24

PREAI

Rahman, Sheikh Shah Mohammad Motiur; Salomon, Michel; Dembele, Sounkalo

Three-dimensional metrology of microturning tool edge radii

PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY

IF3.7

2024-06-01

PREAI

Beb, Mayra Yucely; Tadjouddine, Yanis; Boucheny, Alexandre; Lehmann, Olivier; Rauch, Jean -Yves; Dembele, Sounkalo; Piat, Nadine; Thibaud, Sebastien

Qualitative evidence of the flexoelectric effect in a single multi-wall carbon nanotube by nanorobotic manipulation

APPLIED PHYSICS LETTERS

IF3.6

2022-01-18

OAAI

El Beainou, R.; Rauch, J. -y.; Dembele, S.; Lehmann, O.; Hirsinger, L.; Devel, M.

Image-Guided Nanopositioning Scheme for SEM

IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING

IF6.4

2018-01-01

OAAI

Marturi, Naresh; Tamadazte, Brahim; Dembele, Sounkalo; Piat, Nadine

Visual Servoing-Based Depth-Estimation Technique for Manipulation Inside SEM

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2016-08-01

OAAI

Marturi, Naresh; Tamadazte, Brahim; Dembele, Sounkalo; Piat, Nadine

TOWARD FAST CALIBRATION OF GLOBAL DRIFT IN SCANNING ELECTRON MICROSCOPES WITH RESPECT TO TIME AND MAGNIFICATION

INTERNATIONAL JOURNAL OF OPTOMECHATRONICS

IF2.3

2012-01-01

OAAI

Malti, Abed C.; Dembele, Sounkalo; Piat, Nadine; Arnoult, Claire; Marturi, Naresh

CAD Model-based Tracking and 3D Visual-based Control for MEMS Microassembly 基于CAD模型的MEMS微装配跟踪和三维视觉控制

INTERNATIONAL JOURNAL OF ROBOTICS RESEARCH

IF5

2010-07-29

OAAI

Tamadazte, B.; Marchand, E.; Dembele, S.; Le Fort-Piat, N.

Phase-sensitive vision technique for high accuracy position measurement of moving targets 运动目标高精度位置测量的相敏视觉技术

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2000-01-01

PREAI

Sandoz, P; Ravassard, JC; Dembélé, S; Janex, A

研究方向