arrow
返回
S

Sandeepan DasGupta

united states department of energy (doe)

20H指数
87论文数
1.4K被引数
收录论文 7
发表时间
A Review of GaN HEMT Dynamic ON-Resistance and Dynamic Stress Effects on Field Distribution
err2024-01-01
err7
PREAI
errGill, Lee; DasGupta, Sandeepan; Neely, Jason C.; Kaplar, Robert J.; Michaels, Alan J.
err分享
err收藏
Identification of the defect dominating high temperature reverse leakage current in vertical GaN power diodes through deep level transient spectroscopy
err2022-01-31
err7
errOAAI
errDasGupta, S.; Slobodyan, O.; Smith, T.; Binder, A.; Flicker, J.; Kaplar, R.; Mueller, J.; Garcia Rodriguez, L.; Atcitty, S.
err分享
err收藏
Electrically induced insulator to metal transition in epitaxial SmNiO3 thin films (vol 105, 012108, 2014)
err2014-07-25
err1
errOAAI
errShukla, Nikhil; Joshi, Toyanath; Dasgupta, Sandeepan; Borisov, Pavel; Lederman, David; Datta, Suman
err分享
err收藏
Electrically induced insulator to metal transition in epitaxial SmNiO3 thin films
err2014-07-11
err46
errOAAI
errShukla, Nikhil; Joshi, Toyanath; Dasgupta, Sandeepan; Borisov, Pavel; Lederman, David; Datta, Suman
err分享
err收藏
Role of barrier structure in current collapse of AlGaN/GaN high electron mobility transistors
err2012-12-12
err11
PREAI
errDasGupta, Sandeepan; Biedermann, Laura B.; Sun, Min; Kaplar, Robert; Marinella, Matthew; Zavadil, Kevin R.; Atcitty, Stan; Palacios, Tomas
err分享
err收藏
Sub-bandgap light-induced carrier generation at room temperature in 4H-SiC metal oxide semiconductor capacitors
err2011-10-24
err1
PREAI
errDasGupta, Sandeepan; Armstrong, Andrew; Kaplar, Robert; Marinella, Matthew; Brock, Reinhard; Smith, Mark; Atcitty, Stan
err分享
err收藏
Extraction of trapped charge in 4H-SiC metal oxide semiconductor field effect transistors from subthreshold characteristics
err2011-07-15
err31
PREAI
errDasGupta, Sandeepan; Brock, Reinhard; Kaplar, Robert; Marinella, Matthew; Smith, Mark; Atcitty, Stanley
err分享
err收藏