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S

Souvik Mahapatra

Nanyang Technological University

40H指数
360论文数
7.8K被引数
收录论文 6
发表时间
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Accurate Threshold Voltage Reliability Evaluation of Thin Al2O3 Top-Gated Dielectric Black Phosphorous FETs Using Ultrafast Measurement Pulses
errACS APPLIED MATERIALS & INTERFACES
IF8.2
err2019-06-06
err12
PREAI
errGoyal, Natasha; Parihar, Narendra; Jawa, Himani; Mahapatra, Souvik; Lodha, Saurabh
err分享
err收藏
Study of charge distribution and charge loss in dual-layer metal-nanocrystal-embedded high-κ/SiO2 gate stack
errAPPLIED PHYSICS LETTERS
IF3.6
err2012-05-10
err1
errOAAI
errLwin, Z. Z.; Pey, K. L.; Zhang, Q.; Bosman, M.; Liu, Q.; Gan, C. L.; Singh, P. K.; Mahapatra, S.
err分享
err收藏
Localized charge trapping and lateral charge diffusion in metal nanocrystal-embedded High-κ/SiO2 gate stack
errAPPLIED PHYSICS LETTERS
IF3.6
err2011-11-28
err10
errOAAI
errLwin, Z. Z.; Pey, K. L.; Liu, C.; Liu, Q.; Zhang, Q.; Chen, Y. N.; Singh, P. K.; Mahapatra, S.
err分享
err收藏
Observation of double peak in the substrate current versus gate voltage characteristics of n-channel metal-oxide-semiconductor field effect transistors
errAPPLIED PHYSICS LETTERS
IF3.6
err2001-04-09
err2
PREAI
errAnil, KG; Eisele, I; Mahapatra, S
err分享
err收藏
LEAST-SQUARE COLLOCATION AS APPLIED TO THE ANALYSIS OF STRIP TRANSMISSION-LINES
errPROCEEDINGS OF THE IEEE
IF25.9
err1979-01-01
err3
PREAI
errSESHADRI, TK; MAHAPATRA, S; RAJAIAH, K
err分享
err收藏
NEW ACTIVE RC CIRCUIT REALIZATION OF A 3RD-ORDER LOW-PASS BUTTERWORTH CHARACTERISTIC USING GROUNDED CAPACITORS AND EQUAL-VALUED PASSIVE ELEMENTS
errPROCEEDINGS OF THE IEEE
IF25.9
err1975-01-01
err3
PREAI
errNAIMPALLY, SV; MAHAPATRA, S
err分享
err收藏

研究方向

暂时未获取到该数据
合作学者
合作期刊
张庆 封面图
张庆 (Qing Zhang)
H 指数: 88 · 论文数: 1.1K
M
Michel Bosman
H 指数: 51 · 论文数: 287
C
Chee Lip Gan
H 指数: 40 · 论文数: 300
K
K. L. Pey
H 指数: 38 · 论文数: 511
I
I. Eisele
H 指数: 37 · 论文数: 356
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