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D
Du‐Ming Tsai
yuan ze university
46
H指数
126
论文数
6.1K
被引数
0
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60
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被引数
Accurate Vision-Based PCB Positioning Using Cosine-Convolutional Neural Networks
基于余弦卷积神经网络的PCB精确视觉定位
IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING
IF
6.4
2024-07-01
1
PRE
AI
Solorzano, Carlos; Tsai, Du-Ming
分享
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Fault Diagnosis of Wafer Acceptance Test and Chip Probing Between Front-End-of-Line and Back-End-of-Line Processes
IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING
IF
6.4
2022-10-01
28
PRE
AI
Fan, Shu-Kai S.; Cheng, Chun-Wei; Tsai, Du-Ming
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Key Feature Identification for Monitoring Wafer-to-Wafer Variation in Semiconductor Manufacturing
IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING
IF
6.4
2022-07-01
12
PRE
AI
Fan, Shu-Kai S.; Hsu, Chia-Yu; Tsai, Du-Ming; Chou, Mabel C.; Jen, Chih-Hung; Tsou, Jen-Hsuan
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Autoencoder-based anomaly detection for surface defect inspection
基于自动编码器的表面缺陷异常检测
ADVANCED ENGINEERING INFORMATICS
IF
9.9
2021-04-01
65
PRE
AI
Tsai, Du-Ming; Jen, Po-Hao
分享
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Auto-Annotated Deep Segmentation for Surface Defect Detection
用于表面缺陷检测的自动注释深度分割
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
IF
5.9
2021-01-01
56
PRE
AI
Tsai, Du-Ming; Fan, Shu-Kai S.; Chou, Yi-Hsiang
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Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing
IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING
IF
6.4
2020-10-01
84
PRE
AI
Fan, Shu-Kai S.; Hsu, Chia-Yu; Tsai, Du-Ming; He, Fei; Cheng, Chun-Chung
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Fast and Precise Positioning in PCBs Using Deep Neural Network Regression
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
IF
5.9
2020-07-01
26
PRE
AI
Tsai, Du-Ming; Chou, Yi-Hsiang
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Morphology-based defect detection in machined surfaces with circular tool-mark patterns
具有圆形工具标记图案的加工表面中基于形态的缺陷检测
MEASUREMENT
IF
5.6
2019-02-01
39
PRE
AI
Tsai, Du-Ming; Molina, Daniel E. Rivera
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Machine Vision-Based Positioning and Inspection Using Expectation-Maximization Technique
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
IF
5.9
2017-11-01
54
PRE
AI
Tsai, Du-ming; Hsieh, Yi-chun
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Coffee plantation area recognition in satellite images using Fourier transform
COMPUTERS AND ELECTRONICS IN AGRICULTURE
IF
8.9
2017-04-01
15
PRE
AI
Tsai, Du-Ming; Chen, Wan-Ling
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Defect detection in multi-crystal solar cells using clustering with uniformity measures
使用具有均匀性度量的聚类在多晶太阳能电池中的缺陷检测
ADVANCED ENGINEERING INFORMATICS
IF
9.9
2015-08-01
49
PRE
AI
Tsai, Du-Ming; Li, Guan-Nan; Li, Wei-Chen; Chiu, Wei-Yao
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A motion and image analysis method for automatic detection of estrus and mating behavior in cattle
COMPUTERS AND ELECTRONICS IN AGRICULTURE
IF
8.9
2014-06-01
67
PRE
AI
Tsai, Du-Ming; Huang, Ching-Ying
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Machine-vision-based identification for wafer tracking in solar cell manufacturing
ROBOTICS AND COMPUTER-INTEGRATED MANUFACTURING
IF
11.4
2013-10-01
20
PRE
AI
Tsai, Du-Ming; Lin, Ming-Chin
分享
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Defect Detection in Solar Modules Using ICA Basis Images
IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS
IF
9.9
2013-02-01
149
PRE
AI
Tsai, Du-Ming; Wu, Shih-Chieh; Chiu, Wei-Yao
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Defect detection of solar cells in electroluminescence images using Fourier image reconstruction
SOLAR ENERGY MATERIALS AND SOLAR CELLS
IF
6.3
2012-04-01
143
PRE
AI
Tsai, Du-Ming; Wu, Shih-Chieh; Li, Wei-Chen
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A Shift-Tolerant Dissimilarity Measure for Surface Defect Detection
IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS
IF
9.9
2012-02-01
67
PRE
AI
Tsai, Du-Ming; Chiang, I-Yung; Tsai, Ya-Hui
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Wavelet-based defect detection in solar wafer images with inhomogeneous texture
基于小波的非均匀纹理太阳能晶片图像缺陷检测
PATTERN RECOGNITION
IF
7.6
2012-02-01
94
PRE
AI
Li, Wei-Chen; Tsai, Du-Ming
分享
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Automatic saw-mark detection in multicrystalline solar wafer images
多晶太阳能晶片图像中的自动锯痕检测
SOLAR ENERGY MATERIALS AND SOLAR CELLS
IF
6.3
2011-08-01
32
PRE
AI
Li, Wei-Chen; Tsai, Du-Ming
分享
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Fuzzy C-means based clustering for linearly and nonlinearly separable data
基于模糊C均值的线性和非线性可分数据聚类
PATTERN RECOGNITION
IF
7.6
2011-08-01
99
PRE
AI
Tsai, Du-Ming; Lin, Chung-Chan
分享
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Mean Shift-Based Defect Detection in Multicrystalline Solar Wafer Surfaces
基于均值漂移的多晶太阳能晶片表面缺陷检测
IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS
IF
9.9
2011-02-01
92
PRE
AI
Tsai, Du-Ming; Luo, Jie-Yu
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研究方向
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合作学者
合作期刊
M
Mu‐Chen Chen
H 指数: 44 · 论文数: 145
H
Huei‐Tse Hou
H 指数: 40 · 论文数: 206
C
Chi-Jie Lu
H 指数: 35 · 论文数: 131
李
李刚
(Guannan Li)
H 指数: 32 · 论文数: 101
S
Shu‐Kai S. Fan
H 指数: 31 · 论文数: 114
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