C. J. Powell - Publications, H-index & Citations

Comparisons of Analytical Approaches for Determining Shell Thicknesses of Core-Shell Nanoparticles by X-ray Photoelectron Spectroscopy

IF3.2

2020-07-13

PREAI

Jablonski, A.; Powell, C. J.

Evaluation of Two Methods for Determining Shell Thicknesses of Core-Shell Nanoparticles by X-ray Photoelectron Spectroscopy

IF3.2

2018-02-09

OAAI

Powell, C. J.; Werner, W. S. M.; Kalbe, H.; Shard, A. G.; Castner, D. G.

Quantitative interpretation of molecular dynamics simulations for X-ray photoelectron spectroscopy of aqueous solutions

IF3.2

2016-09-27

OAAI

Powell, C. J.; Werner, W. S. M.; Shard, A. G.; Castner, D. G.

JOURNAL OF CHEMICAL PHYSICS

IF3.1

2016-04-19

OAAI

Olivieri, Giorgia; Parry, Krista M.; Powell, Cedric J.; Tobias, Douglas J.; Brown, Matthew A.

Evaluating the Internal Structure of Core Shell Nanoparticles Using X-ray Photoelectron Intensities and Simulated Spectra (vol 119, pg 17687, 2015)

Evaluating the Internal Structure of Core-Shell Nanoparticles Using X-ray Photoelectron Intensities and Simulated Spectra

IF3.2

2016-01-27

PREAI

Chudzicki, M.; Werner, W. S. M.; Shard, A. G.; Wang, Y. -C.; Castner, D. G.; Powell, C. J.

Interpretation of nanoparticle X-ray photoelectron intensities

IF3.2

2015-07-29

OAAI

Chudzicki, M.; Werner, W. S. M.; Shard, A. G.; Wang, Y-C; Castner, D. G.; Powell, C. J.

APPLIED PHYSICS LETTERS

IF3.6

2014-06-17

PREAI

Werner, Wolfgang S. M.; Chudzicki, Maksymillian; Smekal, Werner; Powell, Cedric J.

Cross Sections for Inner-Shell Ionization by Electron Impact

Improved algorithm for calculating transport cross sections of electrons with energies from 50 eV to 30 keV

IF3.2

2014-01-16

147

PREAI

Llovet, Xavier; Powell, Cedric J.; Salvat, Francesc; Jablonski, Aleksander

PHYSICAL REVIEW B

IF3.7

2007-08-22

PREAI

Jablonski, A.; Powell, C. J.

Refined calculations of effective attenuation lengths for SiO2 film thicknesses by x-ray photoelectron spectroscopy

APPLIED PHYSICS LETTERS

IF3.6

2006-12-21

OAAI

Powell, C. J.; Werner, W. S. M.; Smekal, W.

Distinguishability of N composition profiles in SiON films on Si by angle-resolved x-ray photoelectron spectroscopy

APPLIED PHYSICS LETTERS

IF3.6

2006-10-23

PREAI

Powell, C. J.; Werner, W. S. M.; Smekal, W.

Characterization of thin films on the nanometer scale by Auger electron spectroscopy and X-ray photoelectron spectroscopy (vol 239, pg 470, 2005)

Monte Carlo simulations of electron transport in solids: applications to electron backscattering from surfaces

IF6.9

2005-04-01

PREAI

Powell, CJ; Jablonski, A; Werner, WSM; Smekal, W

Characterization of thin films on the nanometer scale by Auger electron spectroscopy and X-ray photoelectron spectroscopy 通过俄歇电子能谱和x射线光电子能谱表征纳米级薄膜

IF6.9

2005-04-01

PREAI

Jablonski, A; Powell, CJ

Effect of backscattered electrons on the analysis area in scanning Auger microscopy

IF6.9

2005-01-01

PREAI

Powell, CJ; Jablonski, A; Werner, WSM; Smekal, W

Comparison of electron elastic-scattering cross sections calculated from two commonly used atomic potentials

IF6.9

2004-05-01

PREAI

Powell, CJ

Electron effective attenuation lengths in electron spectroscopies

IF3.2

2004-03-26

198

PREAI

Jablonski, A; Salvat, F; Powell, CJ

JOURNAL OF ALLOYS AND COMPOUNDS

IF6.3

2004-01-01

PREAI

Jablonski, A; Powell, CJ

Evaluation of calculated and measured electron inelastic mean free paths near solid surfaces