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J

Jie Fan

Beijing Academy of Quantum Information Sciences
H指数:19
被引数:1,011

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Insight into the suppression mechanism of bulk traps in Al2O3 gate dielectric and its effect on threshold voltage instability in Al2O3/AlGaN/GaN metal-oxide-semiconductor high electron mobility transistors

Al2O3栅介质体陷阱的抑制机理及其对Al2O3/AlGaN/GaN金属氧化物半导体高电子迁移率晶体管阈值电压不稳定性的影响

APPLIED SURFACE SCIENCE
IF6.9
2023-11-0112
PRE
Deng, Kexin; Huang, Sen; Wang, Xinhua; Jiang, Qimeng; Yin, Haibo; Fan, Jie; Jing, Guanjun; Wei, Ke; Zheng, Yingkui; Shi, Jingyuan; Liu, Xinyu
Effective Suppression of Amorphous Ga2O and Related Deep Levels on the GaN Surface by High-Temperature Remote Plasma Pretreatments in GaN-Based Metal-Insulator-Semiconductor Electronic Devices

在GaN基金属-绝缘体-半导体电子器件中通过高温远程等离子体预处理有效抑制GaN表面上的非晶Ga2O和相关深能级

ACS APPLIED MATERIALS & INTERFACES
IF8.2
2023-05-1014
PRE
Deng, Kexin; Wang, Xinhua; Huang, Sen; Li, Pengfei; Jiang, Qimeng; Yin, Haibo; Fan, Jie; Wei, Ke; Zheng, Yingkui; Shi, Jingyuan; Liu, Xinyu
Effective suppression of deep interface states and dielectric trapping in SiNx/GaN metal-insulator-semiconductor structures by a SiOxNy interfacial layer grown by plasma-enhanced atomic layer deposition

通过等离子体增强原子层沉积生长的SiOxNy界面层有效抑制SiNx/GaN金属-绝缘体-半导体结构中的深界面态和介电俘获

APPLIED SURFACE SCIENCE
IF6.9
2023-01-019
PRE
Deng, Kexin; Wang, Xinhua; Huang, Sen; Jiang, Qimeng; Yin, Haibo; Fan, Jie; Jing, Guanjun; Wang, Yingjie; Luan, Tiantian; Wei, Ke; Zheng, Yingkui; Shi, Jingyuan; Liu, Xinyu

研究方向

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Z
Zhongqing Ji
H 指数:13论文数:75被引数:1,251
G
Guangtong Liu
H 指数:22论文数:164被引数:3,960
F
Fanming Qu
H 指数:20论文数:112被引数:2,352
X
Xiunian Jing
H 指数:11论文数:73被引数:336
X
Xinyu Liu
H 指数:57论文数:904被引数:1.3万
L
Li Lü
H 指数:38论文数:214被引数:1.3万
X
Xinhua Wang
H 指数:33论文数:218被引数:3,983
W
Wei Ke
H 指数:70论文数:635被引数:1.8万
S
Sen Huang
H 指数:40论文数:296被引数:5,202
H
Haibo Yin
H 指数:18论文数:88被引数:819