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Rajinder Sandhu

northrop grumman corporation

26H指数
141论文数
2.1K被引数
收录论文 19
发表时间
SLA-based Multi-dimensional Trust Model for Fog Computing Environments
err2022-12-23
err5
PREAI
errChang, Victor; Sidhu, Jagpreet; Singh, Sarbjeet; Sandhu, Rajinder
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On the design and implementation of a secure blockchain-based hybrid framework for Industrial Internet-of-Things
err2021-05-01
err40
errOAAI
errRathee, Geetanjali; Ahmad, Farhan; Sandhu, Rajinder; Kerrache, Chaker Abdelaziz; Azad, Muhammad Ajmal
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Approaching the Practical Conductivity Limits of Aerosol Jet Printed Silver接近气溶胶喷射印刷银的实际电导率极限
err2020-06-18
err36
errOAAI
errRosker, Eva S.; Barako, Michael T.; Nguyen, Evan; DiMarzio, Don; Kisslinger, Kim; Duan, Dah-Weih; Sandhu, Rajinder; Goorsky, Mark S.; Tice, Jesse
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IoT, big data and HPC based smart flood management framework
err2018-12-01
err53
errOAAI
errSood, Sandeep K.; Sandhu, Rajinder; Singla, Karan; Chang, Victor
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A cybersecurity framework to identify malicious edge device in fog computing and cloud-of-things environments
err2018-05-01
err153
errOAAI
errSohal, Amandeep Singh; Sandhu, Rajinder; Sood, Sandeep K.; Chang, Victor
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Thermal conduction inhomogeneity of nanocrystalline diamond films by dual-side thermoreflectance (vol 102, 111907, 2013)
err2016-04-29
err0
errOAAI
errBozorg-Grayeli, Elah; Sood, Aditya; Asheghi, Mehdi; Gambin, Vincent; Sandhu, Rajinder; Feygelson, Tatyana I.; Pate, Bradford B.; Hobart, Karl D.; Goodson, Kenneth E.
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Thermal conduction inhomogeneity of nanocrystalline diamond films by dual-side thermoreflectance
err2013-03-20
err31
PREAI
errBozorg-Grayeli, Elah; Sood, Aditya; Asheghi, Mehdi; Gambin, Vincent; Sandhu, Rajinder; Feygelson, Tatyana I.; Pate, Bradford B.; Hobart, Karl; Goodson, Kenneth E.
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Determination of wafer bonding mechanisms for plasma activated SiN films with x-ray reflectivity
err2005-05-06
err12
PREAI
errHayashi, S; Sandhu, R; Wojtowicz, M; Sun, Y; Hicks, R; Goorsky, MS
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Scans along arbitrary directions in reciprocal space and the analysis of GaN films on SiC
err2005-05-06
err19
PREAI
errPoust, B; Heying, B; Hayashi, S; Ho, R; Matney, K; Sandhu, R; Wojtowicz, M; Goorsky, M
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SiC substrate defects and III-N heteroepitaxy
err2003-04-29
err18
PREAI
errPoust, BD; Koga, TS; Sandhu, R; Heying, B; Hsing, R; Wojtowicz, M; Khan, A; Goorsky, MS
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