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F
Frédéric Richardeau
Universite de Toulouse
20
H指数
235
论文数
3.1K
被引数
0
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19
发表时间
发表时间
IF
被引数
In-depth 2D FEM analysis of gate cracking in SiC MOSFETs under repetitive short-circuit conditions: Application of a damage-based model for crack length prediction
基于损伤模型的SiC MOSFET重复短路条件下载流子裂纹的深度二维有限元分析:裂纹长度预测的应用
Microelectronics Reliability
IF
1.9
2026-01-01
0
PRE
AI
Shqair, Mustafa; Sarraute, Emmanuel; Richardeau, Frederic
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Gate Voltage Dip as a New Indicator for Online Health Monitoring of SiC MOSFETS
IEEE TRANSACTIONS ON POWER ELECTRONICS
IF
6.5
2025-01-01
0
OA
AI
Picot-Digoix, Mathis; Richardeau, Frederic; Blaquiere, Jean-Marc; Vinnac, Sebastien; Azzopardi, Stephane; Le, Thanh-Long
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Quasi-Flying Gate Concept Used for Short-Circuit Detection on SiC Power MOSFETs Based on a Dual-Port Gate Driver
IEEE TRANSACTIONS ON POWER ELECTRONICS
IF
6.5
2023-06-01
5
PRE
AI
Picot-Digoix, Mathis; Richardeau, Frederic; Blaquiere, Jean-Marc; Vinnac, Sebastien; Azzopardi, Stephane; Le, Thanh-Long
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CMOS Active Gate Driver for Closed-Loop dv/dt Control of GaN Transistors
IEEE TRANSACTIONS ON POWER ELECTRONICS
IF
6.5
2020-12-01
27
OA
AI
Bau, Plinio; Cousineau, Marc; Cougo, Bernardo; Richardeau, Frederic; Rouger, Nicolas
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Versatile Three-Level FC-NPC Converter With High Fault-Tolerance Capabilities: Switch Fault Detection and Isolation and Safe Postfault Operation
具有高容错能力的多功能三电平fc-npc转换器: 开关故障检测和隔离以及安全的故障后操作
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
IF
7.2
2017-08-01
32
OA
AI
Bennani-Ben Abdelghani, Afef; Ben Abdelghani, Hafedh; Richardeau, Frederic; Blaquiere, Jean-Marc; Mosser, Franck; Slama-Belkhodja, Ilhem
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Reliability Calculation of Multilevel Converters: Theory and Applications
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
IF
7.2
2013-10-01
173
PRE
AI
Richardeau, Frederic; Pham, T. T. L.
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Real-Time Monitoring for a Five-Level Double-Boost Power Factor Controller Including Postfault Reconfiguration
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
IF
7.2
2013-09-01
6
PRE
AI
Thi Thuy Linh Pham; Richardeau, Frederic; Gateau, Guillaume
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Evaluation of Vce Monitoring as a Real-Time Method to Estimate Aging of Bond Wire-IGBT Modules Stressed by Power Cycling
评估Vce监测作为一种实时方法,以估计受功率循环影响的键合线IGBT模块的老化
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
IF
7.2
2013-07-01
201
PRE
AI
Smet, Vanessa; Forest, Francois; Huselstein, Jean-Jacques; Rashed, Amgad; Richardeau, Frederic
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New Multilevel Converters Based on Stacked Commutation Cells With Shared Power Devices
基于具有共享功率设备的堆叠换向单元的新型多电平转换器
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
IF
7.2
2011-10-01
18
PRE
AI
Floricau, Dan; Richardeau, Frederic
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Ageing and Failure Modes of IGBT Modules in High-Temperature Power Cycling
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
IF
7.2
2011-10-01
516
PRE
AI
Smet, Vanessa; Forest, Francois; Huselstein, Jean-Jacques; Richardeau, Frederic; Khatir, Zoubir; Lefebvre, Stephane; Berkani, Mounira
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Survey on Fault Operation on Multilevel Inverters
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
IF
7.2
2010-07-01
338
PRE
AI
Lezana, Pablo; Pou, Josep; Meynard, Thierry A.; Rodriguez, Jose; Ceballos, Salvador; Richardeau, Frederic
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Architecture complexity and energy efficiency of small wind turbines
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
IF
7.2
2007-02-01
168
PRE
AI
Mirecki, Adam; Roboam, Xavier; Richardeau, Feredric
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Use of opposition method in the test of high-power electronic converters
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
IF
7.2
2006-04-01
79
PRE
AI
Forest, F; Huselstein, JJ; Faucher, S; Elghazouani, M; Ladoux, P; Meynard, TA; Richardeau, F; Turpin, C
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Using the multilevel imbricated cells topologies in the design of low-power power-factor-corrector converters
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
IF
7.2
2005-02-01
24
PRE
AI
Forest, F; Meynard, TA; Faucher, S; Richardeau, F; Huselstein, JJ; Joubert, C
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Switching faults and safe control of an ARCP multicell flying capacitor inverter
IEEE TRANSACTIONS ON POWER ELECTRONICS
IF
6.5
2003-09-01
11
PRE
AI
Turpin, C; Forest, F; Richardeau, F; Meynard, TA; Lacarnoy, A
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A ZVS imbricated cell multilevel inverter with auxiliary resonant commutated poles
IEEE TRANSACTIONS ON POWER ELECTRONICS
IF
6.5
2002-11-01
23
PRE
AI
Turpin, C; Deprez, L; Forest, F; Richardeau, F; Meynard, TA
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Failures-tolerance and remedial strategies of a PWM multicell inverter
IEEE TRANSACTIONS ON POWER ELECTRONICS
IF
6.5
2002-11-01
112
PRE
AI
Richardeau, F; Baudesson, P; Meynard, TA
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Fault management of multicell converters
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
IF
7.2
2002-10-01
108
PRE
AI
Turpin, C; Baudesson, P; Richardeau, F; Forest, F; Meynard, TA
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Multicell converters: Derived topologies
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS
IF
7.2
2002-10-01
194
PRE
AI
Meynard, TA; Foch, H; Forest, F; Turpin, C; Richardeau, F; Delmas, L; Gateau, G; Lefeuvre, E
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研究方向
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合作学者
合作期刊
J
José Rodríguez
H 指数: 113 · 论文数: 1.3K
J
Josep Pou
H 指数: 72 · 论文数: 507
S
Salvador Ceballos
H 指数: 46 · 论文数: 182
É
Élie Lefeuvre
H 指数: 37 · 论文数: 209
P
Pablo Lezana
H 指数: 30 · 论文数: 78
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