Michael J. Havrilla - Publications, H-index & Citations

Michael J. Havrilla

air force institute of technology (afit)

17H指数

131论文数

1.0K被引数

收录论文 19

发表时间

Nondestructive Electromagnetic Characterization of Uniaxial Sheet Media Using a Two-Flanged Rectangular Waveguide Probe

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2020-06-01

OAAI

Rogers, Neil; Havrilla, Michael; Hyde, Milo W.; Knisely, Alexander

High-Temperature RF Material Characterization Using a Dual-Chambered Rectangular Waveguide Fixture

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2017-09-01

PREAI

Bogle, Andrew E.; Hyde, Milo W.; Havrilla, Michael J.; Sovern, Jeffrey S.

Analysis and numerical solution of transient electromagnetic scattering from two cavities

JOURNAL OF COMPUTATIONAL PHYSICS

IF3.8

2017-08-01

PREAI

Uber, Richard; Wood, Aihua; Havrilla, Michael

A Broadband, Nondestructive Microwave Sensor for Characterizing Magnetic Sheet Materials

IEEE SENSORS JOURNAL

IF4.5

2016-06-01

PREAI

Hyde, Milo W.; Havrilla, Michael J.

Nondestructive characterization of Salisbury screen and Jaumann absorbers using a clamped rectangular waveguide geometry

MEASUREMENT

IF5.6

2014-07-01

OAAI

Hyde, Milo W.; Bogle, Andrew E.; Havrilla, Michael J.

Scattering of a partially-coherent wave from a material circular cylinder

OPTICS EXPRESS

IF3.3

2013-12-19

OAAI

Hyde, Milo W.; Bogle, Andrew E.; Havrilla, Michael J.

Broadband Characterization of Materials Using a Dual-Ridged Waveguide

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2013-12-01

OAAI

Hyde, Milo W.; Havrilla, Michael J.; Bogle, Andrew E.; Lehman, Nathan J.

Characterization of Biaxial Anisotropic Material Using a Reduced Aperture Waveguide

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2013-10-01

PREAI

Crowgey, Benjamin R.; Tuncer, Ozgur; Tang, Junyan; Rothwell, Edward J.; Shanker, B.; Kempel, Leo C.; Havrilla, Michael J.

SCALAR POTENTIAL DEPOLARIZING DYAD ARTIFACT FOR A UNIAXIAL MEDIUM

PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER

IF9.3

2013-01-01

OAAI

Havrilla, Michael John

Two-Iris Method for the Electromagnetic Characterization of Conductor-Backed Absorbing Materials Using an Open-Ended Waveguide Probe

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2012-04-01

PREAI

Dester, Gary D.; Rothwell, Edward J.; Havrilla, Michael J.

NONDESTRUCTIVE COMPLEX PERMITTIVITY AND PERMEABILITY EXTRACTION USING A TWO-LAYER DUAL-WAVEGUIDE PROBE MEASUREMENT GEOMETRY

PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER

IF9.3

2012-01-01

OAAI

Seal, M. D.; Hyde, M. W.; Havrilla, M. J.

Adapting Generally Filled Cylindrical Sheet Impedances for Electromagnetic Compatibility

IEEE ANTENNAS AND PROPAGATION MAGAZINE

IF5.7

2011-06-01

PREAI

Massman, Jeffrey P.; Havrilla, Michael J.; Whites, Keith W.

Material Classification of an Unknown Object Using Turbulence-Degraded Polarimetric Imagery

IEEE TRANSACTIONS ON GEOSCIENCE AND REMOTE SENSING

IF8.6

2011-01-01

PREAI

Hyde, Milo W.; Cain, Stephen C.; Schmidt, Jason D.; Havrilla, Michael J.

Analytical Development of the Far-Zone Radiation Integral for an Arbitrary Planar Spiral Antenna

IEEE ANTENNAS AND PROPAGATION MAGAZINE

IF5.7

2010-04-01

PREAI

Barton, Richard J.; Collins, Peter J.; Crittenden, Paul E.; Havrilla, Michael J.; Terzuoli, Andrew J.

A geometrical optics polarimetric bidirectional reflectance distribution function for dielectric and metallic surfaces

OPTICS EXPRESS

IF3.3

2009-11-18

132

OAAI

Hyde, M. W.; Schmidt, J. D.; Havrilla, M. J.

A Novel Method for Determining the R-Card Sheet Impedance Using the Transmission Coefficient Measured in Free-Space or Waveguide Systems

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2009-07-01

PREAI

Hyde, Milo W.; Havrilla, Michael J.; Crittenden, Paul E.

A nondestructive technique for determining complex permittivity and permeability of magnetic sheet materials using two flanged rectangular waveguides

PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER

IF9.3

2008-01-01

OAAI

Hyde, M. W.; Havrilla, M. J.

Electromagnetic characterization of layered materials via direct and de-embed methods

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2006-02-01

PREAI

Havrilla, MJ; Nyquist, DP

Stepped-waveguide material-characterization technique

IEEE ANTENNAS AND PROPAGATION MAGAZINE

IF5.7

2004-02-01

PREAI

Dorey, SP; Havrilla, MJ; Frasch, LL; Choi, C; Rothwell, EJ

研究方向