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R

Rajesh Saha

national institute of technology silchar

20H指数
139论文数
1.3K被引数
收录论文 30
发表时间
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Optical and Noise Characteristics of an Extended-Source DG TFET Photodetector With Trap Impurities and Its Circuit Application扩展源DG TFET光电探测器在陷阱杂质存在下的光学和噪声特性及其电路应用
errIEEE Transactions on Dielectrics and Electrical Insulation
IF3.1
err2026-05-26
err0
PREAI
errShreyas Tiwari; Rajesh Saha; Tarun Varma
err分享
err收藏
Performance Analysis of L-Shaped Cladding Layer-Based Dopingless TFET Including Interface Trap Charges and Temperatures基于L形包覆层掺杂自由TFET的性能分析，包括界面陷阱电荷和温度
errIEEE Access
IF3.6
err2026-03-23
err0
errOAAI
errS. Shabareeshan; Srinidhi Balakrishnan; Shanidul Hoque; Rajesh Saha
err分享
err收藏
Investigation on Heavy Ion Induced Radiation Effects in Step Shape Hetero-Dielectric Double-Gate with pocket (SSHDDGP) TFET步形异质介质双栅带有口袋（SSHDDGP）TFET中重离子诱导辐射效应的研究
errMicro and Nanostructures
IF3
err2025-11-18
err0
PREAI
errNiraj Kumar; Aryan Sarthak; K. Raju; Rajesh Saha
err分享
err收藏
Radiation Effects in Silicon-On-Insulator n-p-n Double-Gate TFET: A Simulation Study绝缘层上硅n-p-n双栅TFET中的辐射效应：一项模拟研究
errPHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
IF1.9
err2025-11-01
err0
PREAI
errSaha, Jatismar; Choudhuri, Bijit; Saha, Rajesh
err分享
err收藏
Implementing Step-Tunneling Path Tunnel Field-Effect Transistor as a Photosensor: A Simulation Study
errPHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
IF1.9
err2025-10-01
err0
PREAI
errHazarika, Priyambada; Singh, Aman; Saha, Rajesh
err分享
err收藏
Investigating the effects of interface trap charges and temperature on n-type step tunneling path TFET研究界面陷阱电荷和温度对n型阶跃隧穿路径TFET的影响
errANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING
IF1.4
err2025-09-10
err1
PREAI
errSaha, Jatismar; Gogoi, Manosh Protim; Choudhuri, Bijit; Saha, Rajesh
err分享
err收藏
Analysis, Design and Optimization of Current Mode Logic: A State-of-the art Review电流模式逻辑的分析、设计与优化：一项最新进展综述
errIETE TECHNICAL REVIEW
IF1.8
err2025-09-01
err1
PREAI
errBhaskar, Ruchi; Choudhary, Bharat; Saha, Rajesh; Rajput, Dheeraj Singh
err分享
err收藏
Investigating the effects of heavy-ion radiation on n-type Step Tunnelling Path TFET研究重离子辐射对n型步进隧穿路径TFET的影响
errMicro and Nanostructures
IF3
err2025-07-18
err0
PREAI
errJatismar Saha; Manosh Protim Gogoi; Shreyas Tiwari; Bijit Choudhuri; Rajesh Saha
err分享
err收藏
Radiation resilience of Silicon-On-Insulator Vertical Super Thin Body (SOI VSTB) field-effect transistors: A TCAD simulation study on SEE effects绝缘层上硅垂直超薄体场效应晶体管（SOI VSTB）的辐射抗性：关于单粒子效应的TCAD模拟研究
errMicro and Nanostructures
IF3
err2025-06-12
err0
PREAI
errVikas Kumar; Rajesh Saha; Srimanta Baishya
err分享
err收藏
Statistical variability of physically localized interface traps in SOI n-p-n DG TFETs体硅绝缘体(SOI) n-p-n 双栅极隧穿场效应晶体管(DG TFETs)中物理定位界面陷阱的统计变异性
errJOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
IF2.8
err2025-02-21
err0
PREAI
errLahkar, Himangshu; Medhi, Anurag; Deb, Deepjyoti; Saha, Rajesh; Baruah, Ratul Kr.; Goswami, Rupam
err分享
err收藏
Investigation on electrical parameters in nanowire FET and nanosheet FET including trap charges and its circuit applications纳米线FET和纳米片FET中包括陷阱电荷在内的电学参数研究及其电路应用
errMICRO AND NANOSTRUCTURES
IF3
err2025-02-01
err0
PREAI
errGogoi, Manosh Protim; Saha, Rajesh; Baishya, Srimanta
err分享
err收藏
Impact of hindrance and trap impurities on the sensitivity measurement of N-Pocket TFET based biosensor阻碍和陷阱杂质对基于N-Pocket TFET的生物传感器灵敏度测量的影响
errMICRO AND NANOSTRUCTURES
IF3
err2025-02-01
err1
PREAI
errTiwari, Shreyas; Saha, Rajesh; Varma, Tarun
err分享
err收藏
Mobility Aware Spectrum Handoff in 6G-Enabled Cognitive Radio Vehicular Centralized and Ad-Hoc Networks
errIEEE ACCESS
IF3.6
err2025-01-01
err0
errOAAI
errHoque, Shanidul; Sahu, Hemanta Kumar; Hasan, Mohammed Nazibul; Saha, Rajesh
err分享
err收藏
Sensitivity Analysis of Ge Source Double Gate TFET Under Heavy Ion Irradiation重离子辐照下Ge源极双栅TFET的灵敏度分析
errIEEE SENSORS JOURNAL
IF4.5
err2024-11-15
err0
PREAI
errTiwari, Shreyas; Saha, Rajesh; Gopal, Girdhar; Varma, Tarun
err分享
err收藏
Oxide and ferro layer thickness optimization of negative capacitance junctionless VSTB FET to improve electrical and thermal noise performance
errMATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS
IF4.6
err2024-11-01
err1
PREAI
errMaurya, Ravindra Kumar; Kumar, Vivek; Devnath, Radhe G.; Saha, Rajesh; Bhowmick, Brinda
err分享
err收藏
Effects of the remnant polarization on the electrical characteristics of steeper sub-threshold swing Fe-GeFinFET
errMATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS
IF4.6
err2024-05-01
err1
PREAI
errMaurya, Ravindra Kumar; Kumar, Vivek; Saha, Rajesh; Bhowmick, Brinda
err分享
err收藏
Investigation on electrical parameters between single and double material gate nanoribbon FETs including trap distributions
errMATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS
IF4.6
err2024-05-01
err4
PREAI
errRai, Shashank; Tiwari, Shreyas; Chaudhary, Rashi; Saha, Rajesh; Sharma, Ritu
err分享
err收藏
Performances of gate stacked heterojunction SELBOX and SOI tunnel FETs including interface trap charges: A simulation study包括界面陷阱电荷的栅堆叠异质结SELBOX和SOI隧道fet的性能: 模拟研究
errMATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS
IF4.6
err2024-02-01
err2
PREAI
errHarsha, Nagendar; Tiwari, Shreyas; Chaudhary, Rashi; Saha, Rajesh
err分享
err收藏
Quality factor and digital inverter performance in gate underlap and overlap DMG FinFETs
errMATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS
IF4.6
err2024-01-01
err4
PREAI
errChaudhary, Rashi; Saha, Rajesh
err分享
err收藏
Reliability study of nano ribbon FET with temperature variation including interface trap charges含界面陷阱电荷的纳米带状FET随温度变化的可靠性研究
errMATERIALS SCIENCE AND ENGINEERING B-ADVANCED FUNCTIONAL SOLID-STATE MATERIALS
IF4.6
err2023-12-01
err5
PREAI
errTeja, Lakshmi Nivas; Chaudhary, Rashi; Tiwari, Shreyas; Saha, Rajesh
err分享
err收藏

研究方向

暂无研究方向
合作学者
合作期刊
A
Asim Bhaumik
H 指数: 90 · 论文数: 680
A
Asish R. Das
H 指数: 32 · 论文数: 219
G
Gautam Basu
H 指数: 28 · 论文数: 99
J
J. K. Saha
H 指数: 28 · 论文数: 184
B
Brinda Bhowmick
H 指数: 28 · 论文数: 218
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