arrow
返回
W

Wouter Ruythooren

interuniversity microelectronics centre

26H指数
117论文数
2.5K被引数
收录论文 5
发表时间
TSV Cu Plating and Implications for CMP
err2011-04-25
err1
PREAI
errRadisic, A.; Philipsen, H. G. G.; Honore, M.; Wang, Y. S.; Heylen, N.; El-Mekki, Z.; Armini, S.; Vandersmissen, K.; Rodet, S.; Van Ammel, A.; Bender, H.; Drijbooms, C.; Vanstreels, K.; Ruythooren, W.
err分享
err收藏
err分享
err收藏
Filling of microvia with an aspect ratio of 5 by copper electrodeposition
err2009-03-01
err104
PREAI
errLuehn, O.; Van Hoof, C.; Ruythooren, W.; Celis, J. -P.
err分享
err收藏
The role of Al on Ohmic contact formation on n-type GaN and AlGaN/GaN -: art. no. 061908
err2005-08-02
err103
PREAI
errVan Daele, B; Van Tendeloo, G; Ruythooren, W; Derluyn, J; Leys, MR; Germain, M
err分享
err收藏
Microstructural investigation of Co-P by TEM
err2004-01-01
err5
PREAI
errRuythooren, W; De Boeck, J; Celis, JP
err分享
err收藏