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C. Beitia

communaute universite grenoble alpes

11H指数
58论文数
862被引数
收录论文 7
发表时间
Metrology for the next generation of semiconductor devices (vol 1, pg 532, 2018)
err2018-11-09
err3
errOAAI
errOrji, N. G.; Badaroglu, M.; Barnes, B. M.; Beitia, C.; Bunday, B. D.; Celano, U.; Kline, R. J.; Neisser, M.; Obeng, Y.; Vladar, A. E.
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Metrology for the next generation of semiconductor devices下一代半导体器件的计量
err2018-10-12
err329
errOAAI
errOrji, N. G.; Badaroglu, M.; Barnes, B. M.; Beitia, C.; Bunday, B. D.; Celano, U.; Kline, R. J.; Neisser, M.; Obeng, Y.; Vladar, A. E.
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Benefits of XPS nanocharacterization for process development and industrial control of thin SiGe channel layers in advanced CMOS technologies
err2017-11-01
err7
PREAI
errFauquier, L.; Pelissier, B.; Jalabert, D.; Pierre, F.; Hartmann, J. M.; Roze, F.; Doloy, D.; Le Cunff, D.; Beitia, C.; Baron, T.
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Substrate-induced multipolar resonances in supported free-electron metal spheres
err1999-08-15
err31
PREAI
errBeitia, C; Borensztein, Y; Lazzari, R; Nieto, J; Barrera, RG
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Adsorption kinetics of H on Si(111)7x7 by means of surface differential reflectivity
err1997-08-15
err28
PREAI
errBeitia, C; Preyss, W; DelSole, R; Borensztein, Y
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Optical spectroscopy study of hydrogenation of the Si(111)-7x7 surface
err1996-09-01
err5
PREAI
errRoy, M; Beitia, C; Borensztein, Y; Shkrebtii, A; Noguez, C; DelSole, R
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