Keith Fogel - Publications, H-index & Citations

Keith Fogel

international business machines (ibm)

22H指数

83论文数

1.6K被引数

收录论文 11

发表时间

Layer transfer by controlled spalling

JOURNAL OF PHYSICS D-APPLIED PHYSICS

IF3.2

2013-03-21

OAAI

Bedell, Stephen W.; Fogel, Keith; Lauro, Paul; Shahrjerdi, Davood; Ott, John A.; Sadana, Devendra

Ultralight High-Efficiency Flexible InGaP/(In)GaAs Tandem Solar Cells on Plastic

ADVANCED ENERGY MATERIALS

IF26

2012-12-13

PREAI

Shahrjerdi, Davood; Bedell, Stephen W.; Bayram, Can; Lubguban, Cristina C.; Fogel, Keith; Lauro, Paul; Ott, John A.; Hopstaken, Marinus; Gayness, Michael; Sadana, Devendra

High-efficiency heterojunction solar cells on crystalline germanium substrates

APPLIED PHYSICS LETTERS

IF3.6

2012-07-17

PREAI

Hekmatshoar, Bahman; Shahrjerdi, Davood; Hopstaken, Marinus; Fogel, Keith; Sadana, Devendra K.

High-efficiency thin-film InGaP/InGaAs/Ge tandem solar cells enabled by controlled spalling technology

APPLIED PHYSICS LETTERS

IF3.6

2012-02-02

PREAI

Shahrjerdi, D.; Bedell, S. W.; Ebert, C.; Bayram, C.; Hekmatshoar, B.; Fogel, K.; Lauro, P.; Gaynes, M.; Gokmen, T.; Ott, J. A.; Sadana, D. K.

Surface texturing of single-crystalline silicon solar cells using low density SiO2 films as an anisotropic etch mask

SOLAR ENERGY MATERIALS AND SOLAR CELLS

IF6.3

2010-12-01

PREAI

Kim, Jeehwan; Inns, Daniel; Fogel, Keith; Sadana, Devendra K.

The Role of High Work-Function Metallic Nanodots on the Performance of a-Si:H Solar Cells: Offering Ohmic Contact to Light Trapping

ACS NANO

IF16

2010-11-22

PREAI

Kim, Jeehwan; Abou-Kandil, Ahmed; Fogel, Keith; Hovel, Harold; Sadana, Devendra K.

Effects of patterned, stressed SiN overlayers on Si solid phase epitaxy

APPLIED PHYSICS LETTERS

IF3.6

2008-03-24

PREAI

Saenger, K. L.; Fogel, K. E.; Ott, J. A.; de Souza, J. P.; Murray, C. E.

Mixed orientation Si-Si interfaces by hydrophilic bonding and high temperature oxide dissolution

JOURNAL OF THE ELECTROCHEMICAL SOCIETY

IF3.3

2008-01-01

PREAI

Saenger, K. L.; de Souza, J. P.; Fogel, K.; Ott, J. A.; Reznicek, A.; Yin, H.; Sung, C. Y.; Sadana, D. K.

Strain and lattice engineering for GeFET devices

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING

IF4.6

2006-08-01

PREAI

Bedell, S. W.; Reznicek, A.; Fogel, K.; Ott, J.; Sadana, D. K.

Defects and strain relaxation in silicon-germanium-on-insulator formed by high-temperature oxidation

APPLIED PHYSICS LETTERS

IF3.6

2004-12-13

PREAI

Bedell, SW; Fogel, K; Sadana, DK; Chen, H

Observation of stacking faults in strained Si layers

APPLIED PHYSICS LETTERS

IF3.6

2004-09-27

PREAI

Bedell, SW; Fogel, K; Sadana, DK; Chen, H; Domenicucci, A

研究方向