Masaki Mukai - Publications, H-index & Citations

Masaki Mukai

jeol germany gmbh

15H指数

65论文数

1.2K被引数

收录论文 8

发表时间

Next-Generation Atomic-Resolution Spectroscopy and Multidimensional Imaging with the Monochromated JEOL ARMD-TEM 下一代原子级分辨率光谱和多维成像技术与单色化JEOL ARMD-TEM

Microscopy and Microanalysis

IF3

2026-07-27

OAAI

Tobias Heil; Heiko Müller; Stephan Uhlemann; Pirmin Kükelhan; Martin Linck; Hongguang Wang; Akiho Nakamura; Masaki Mukai; Peter A van Aken

Comparison of Analytical Sensitivities of Simultaneously Acquired EELS and XEDS Signals from Same Ionization Processes 同时获取的EELS和XEDS信号来自相同电离过程的解析灵敏度比较

Microscopy and Microanalysis

IF3

2026-07-27

OAAI

Masashi Watanabe; Alexander Campos-Quiros; Giulio Guzzinati; Pirmin Kükelhan; Volker Gerheim; Martin Linck; Heiko Müller; Max Haider; Thomas F Hoffman; Kotaro Sakaguchi; Masaki Mukai; Takeshi Kaneko; Naoki Shimura; Shintaro Hirata; Akiho Nakamura; Masashi Nishikawa; Thomas Isabell; Hidetaka Sawada

Atomic-resolution Li Analysis in Al-Li Alloy System by Electron Energy-loss Spectrometry in an Aberration-Corrected Scanning Transmission Electron Microscope

Microscopy and Microanalysis

IF3

2025-07-25

OAAI

Masashi Watanabe; Alexander Campos-Quiros; Giulio Guzzinati; Pirmin Kükelhan; Volker Gerheim; Martin Linck; Heiko Müller; Max Haider; Thomas F Hoffman; Kotaro Sakaguchi; Takeshi Kaneko; Masaki Mukai; Thomas Isabell; Naoki Shimura; Hidetaka Sawada

Probing plasmonic excitation mechanisms and far-field radiation of single-crystalline gold tapers with electrons 用电子探测单晶金锥形的等离子体激发机制和远场辐射

PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES

IF3.7

2020-10-26

OAAI

Lingstaedt, Robin; Talebi, Nahid; Guo, Surong; Sigle, Wilfried; Campos, Alfredo; Kociak, Mathieu; Esmann, Martin; Becker, Simon F.; Okunishi, Eiji; Mukai, Masaki; Lienau, Christoph; van Aken, Peter A.

Strain-Dependent Edge Structures in MoS2 Layers MoS2层中的应变相关边缘结构

NANO LETTERS

IF9.1

2017-10-26

OAAI

Tinoco, Miguel; Maduro, Luigi; Masaki, Mukai; Okunishi, Erji; Conesa-Boj, Sonia

Resolution enhancement in transmission electron microscopy with 60-kV monochromated electron source

APPLIED PHYSICS LETTERS

IF3.6

2016-01-08

PREAI

Morishita, Shigeyuki; Mukai, Masaki; Suenaga, Kazutomo; Sawada, Hidetaka