未登录Temperature-Dependent Detrapping Behavior of p-/n-Type Ferroelectric FETs With Si/SiGe Channel
Yang, S.; Muller, F.; Raffel, Y.; Yadav, N.; Hoffmann, R.; Schone, F.; Lehninger, D.; Kampfe, T.; Seidel, K.; Mulaosmanovic, H.; Kleimaier, D.; Dunkel, S.; Beyer, S.; Lederer, M.; Gerlach, G. .png)
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