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Internal filament modulation in low-dielectric gap design for built-in selector-less resistive switching memory applicationJOURNAL OF PHYSICS D-APPLIED PHYSICSIF3.22018-01-1622PREAI
Graphite-based selectorless RRAM: improvable intrinsic nonlinearity for array applicationsNANOSCALEIF5.12018-01-0132PREAI
Beyond SiOx: an active electronics resurgence and biomimetic reactive oxygen species production and regulation from mitochondriaJOURNAL OF MATERIALS CHEMISTRY CIF5.12018-01-019PREAI
Unidirectional threshold resistive switching in Au/NiO/Nb:SrTiO3 devicesAPPLIED PHYSICS LETTERSIF3.62017-06-0727PREAI
Proton exchange reactions in SiOx-based resistive switching memory: Review and insights from impedance spectroscopyPROGRESS IN SOLID STATE CHEMISTRYIF10.52016-09-0142PREAI
Demonstration of Synaptic Behaviors and Resistive Switching Characterizations by Proton Exchange Reactions in Silicon OxideSCIENTIFIC REPORTSIF3.92016-02-1680OAAI
Study of self-compliance behaviors and internal filament characteristics in intrinsic SiOx-based resistive switching memoryAPPLIED PHYSICS LETTERSIF3.62016-01-2034PREAI
Stabilization of multiple resistance levels by current-sweep in SiOx-based resistive switching memoryAPPLIED PHYSICS LETTERSIF3.62015-02-1343OAAI
Discussion on device structures and hermetic encapsulation for SiOx random access memory operation in airAPPLIED PHYSICS LETTERSIF3.62014-10-2120OAAI
Characterization of external resistance effect and performance optimization in unipolar-type SiOx-based resistive switching memoryAPPLIED PHYSICS LETTERSIF3.62014-09-2918PREAI
Integrated One Diode-One Resistor Architecture in Nanopillar SiOx Resistive Switching Memory by Nanosphere LithographyNANO LETTERSIF9.12013-12-30105PREAI
Effects of sidewall etching on electrical properties of SiOx resistive random access memoryAPPLIED PHYSICS LETTERSIF3.62013-11-2022PREAI
Investigation of edge- and bulk-related resistive switching behaviors and backward-scan effects in SiOx-based resistive switching memoryAPPLIED PHYSICS LETTERSIF3.62013-11-0432PREAI
Oxygen-induced bi-modal failure phenomenon in SiOx-based resistive switching memoryAPPLIED PHYSICS LETTERSIF3.62013-07-1831PREAI
Effect of hydrogen/deuterium incorporation on electroforming voltage of SiOx resistive random access memoryAPPLIED PHYSICS LETTERSIF3.62012-11-0220OAAI
Study of polarity effect in SiOx-based resistive switching memoryAPPLIED PHYSICS LETTERSIF3.62012-07-3051PREAI
Memory switching properties of e-beam evaporated SiOx on N++ Si substrateAPPLIED PHYSICS LETTERSIF3.62012-02-2148PREAI