Wen-Ben Jone - Publications, H-index & Citations | 科言猫

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Wen-Ben Jone

机构信息待补充

16H指数

106论文数

1.1K被引数

收录论文 6

发表时间

Testing analog and mixed-signal circuits with built-in hardware - A new approach

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2007-06-01

37

PREAI

Das, Sunil R.; Zakizadeh, Jila; Biswas, Satyendra; Assaf, Mansour H.; Nayak, Amiya R.; Petriu, Emil M.; Jone, Wen-Ben; Sahinoglu, Mehmet

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Parity bit signature in response data compaction and built-in self-testing of VLSI circuits with nonexhaustive test sets 响应数据压缩中的奇偶校验位签名和具有非穷举测试集的VLSI电路的内置自测试

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2003-10-01

19

PREAI

Das, SR; Sudarma, M; Assaf, MH; Petriu, EM; Jone, WB; Chakrabarty, K; Sahinoglu, M

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An efficient BIST method for non-traditional faults of embedded memory arrays

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2003-10-01

8

PREAI

Jone, WB; Huang, DC; Das, SR

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Data compression in space under generalized mergeability based on concepts of cover table and frequency ordering

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2002-01-01

13

PREAI

Das, SR; Liang, JY; Petriu, EM; Assaf, MF; Jone, WB; Chakrabarty, K

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Fault tolerance in systems design in VLSI using data compression under constraints of failure probabilities

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2001-01-01

44

PREAI

Das, SR; Ramamoorthy, CV; Assaf, MH; Petriu, EM; Jone, WB

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An adaptive path selection method for delay testing

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2001-01-01

6

PREAI

Jone, WB; Yeh, WS; Yeh, CW; Das, SR

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