Zainalabedin Navabi - Publications, H-index & Citations

Zainalabedin Navabi

University of Tehran

21H指数

342论文数

2.2K被引数

收录论文 10

发表时间

Analysis and Enhancement of Resilience for LSTM Accelerators Using Residue-Based CEDs

IEEE ACCESS

IF3.6

2024-01-01

OAAI

Nosrati, Nooshin; Navabi, Zainalabedin

LUT Input Reordering to Reduce Aging Impact on FPGA LUTs

IEEE TRANSACTIONS ON COMPUTERS

IF3.8

2020-10-01

PREAI

Ebrahimi, Mohammad; Sadeghi, Rezgar; Navabi, Zainalabedin

Self-Adjusting Monitor for Measuring Aging Rate and Advancement

IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING

IF5.4

2020-07-01

PREAI

Sadeghi-Kohan, Somayeh; Kamal, Mehdi; Navabi, Zainalabedin

SENSIBle: A Highly Scalable SENsor DeSIgn for Path-Based Age Monitoring in FPGAs

IEEE TRANSACTIONS ON COMPUTERS

IF3.8

2017-05-01

PREAI

Ghaderi, Zana; Ebrahimi, Mohammad; Navabi, Zainalabedin; Bozorgzadeh, Eli; Bagherzadeh, Nader

Automatic High-Level Data-Flow Synthesis and Optimization of Polynomial Datapaths Using Functional Decomposition

IEEE TRANSACTIONS ON COMPUTERS

IF3.8

2014-01-01

PREAI

Ghandali, Samaneh; Alizadeh, Bijan; Fujita, Masahiro; Navabi, Zainalabedin

EDXY - A low cost congestion-aware routing algorithm for network-on-chips

JOURNAL OF SYSTEMS ARCHITECTURE

IF4.1

2010-07-01

PREAI

Lotfi-Kamran, P.; Rahmani, A. M.; Daneshtalab, M.; Afzali-Kusha, A.; Navabi, Z.

A low-power high-throughput link splitting router for NoCs

zhejiang university science b

IF3.9

2008-12-01

PREAI

Saneei, Mohsen; Afzali-Kusha, Ali; Navabi, Zainalabedin

A selective trigger scan architecture for VLSI testing

IEEE TRANSACTIONS ON COMPUTERS

IF3.8

2008-01-01

PREAI

Hosseinabady, Mohammad; Sharifi, Shervin; Lombardi, Fabrizio; Navabi, Zainalabedin

Test access to deeply embedded analog terminals within an A/MS SoC 测试对A/MS SoC内深度嵌入的模拟终端的访问

zhejiang university science b

IF3.9

2007-10-01

PREAI

Rahebeh, Niaraki Asli; Sattar, Mirzakuchaki; Zainalabedin, Navabi; Michel, Renovell

Using data compression in automatic test equipment for system-on-chip testing 在片上系统测试的自动测试设备中使用数据压缩

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

IF5.9

2004-04-01

PREAI

Karimi, F; Navabi, Z; Meleis, WM; Lombardi, F

研究方向