I. Dói - Publications, H-index & Citations

I. Dói

universidade estadual de campinas

12H指数

108论文数

656被引数

收录论文 8

发表时间

Surface passivation of InGaP/GaAs HBT using silicon-nitride film deposited by ECR-CVD plasma 使用通过ecr-cvd等离子体沉积的氮化硅膜对InGaP/GaAs HBT进行表面钝化

APPLIED SURFACE SCIENCE

IF6.9

2008-07-01

PREAI

Manera, L. T.; Zoccal, L. B.; Diniz, J. A.; Tatsch, P. J.; Doi, I.

Structural characterization of SiGe nanoclusters formed by rapid thermal annealing

APPLIED SURFACE SCIENCE

IF6.9

2008-07-01

PREAI

dos Anjos, Alexandre Miranda P.; Doi, Ioshiaki; Diniz, Jose Alexandre

Structural and surface properties of Si1-xGex thin films obtained by reduced pressure CVD

APPLIED SURFACE SCIENCE

IF6.9

2007-10-01

PREAI

Teixeira, R. C.; Doi, I.; Diniz, J. A.; Swart, J. W.; Zakia, M. B. P.

Fabrication and characterization of Ge nanocrystalline growth by ion implantation in SiO2 matrix

JOURNAL OF MATERIALS SCIENCE

IF3.9

2007-09-01

PREAI

Mestanza, S. N. M.; Doi, I.; Swart, J. W.; Frateschi, N. C.

Development of process for far infrared sensor fabrication

SENSORS AND ACTUATORS A-PHYSICAL

IF4.9

2006-11-01

PREAI

Neli, Roberto R.; Doi, Ioshiaki; Diniz, Jose A.; Swart, Jacobus W.

Silicon nitride deposited by ECR-CVD at room temperature for LOCOS isolation technology

APPLIED SURFACE SCIENCE

IF6.9

2003-05-01

PREAI

Pereira, MA; Diniz, JA; Doi, I; Swart, JW

Si-LiG process for inductive meso systems

APPLIED SURFACE SCIENCE

IF6.9

2003-05-01

PREAI

Barbaroto, PR; Doi, I; Ferreira, LOS

Insulators obtained by electron cyclotron resonance plasmas on Si or GaAs

MATERIALS CHARACTERIZATION

IF5.5

2003-03-01

PREAI

Diniz, JA; Doi, I; Swart, JW

研究方向