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Young-Mok Bae

sk group

4H指数
24论文数
58被引数
收录论文 6
发表时间
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Edge characteristics metric-guided latent defect chip detection model in semiconductor fabrication边缘特征度量引导的半导体制造中潜在缺陷芯片检测模型
errINTERNATIONAL JOURNAL OF PRODUCTION RESEARCH
IF7.3
err2025-11-01
err0
PREAI
errBae, Young-Mok; Kim, Kwang-Jae
err分享
err收藏
Phase I change-point detection for ordinal profiles with arbitrary design: A nonparametric method and its application to warranty claims analysis有序剖面任意设计下的I阶段变点检测：一种非参数方法及其在保修索赔分析中的应用
errCOMPUTERS & INDUSTRIAL ENGINEERING
IF6.5
err2025-06-06
err0
PREAI
errWang, Zhiqiong; Zhang, Lu; Wang, Ying; Song, Lisha; Zang, Yangyang; Bae, Young-Mok
err分享
err收藏
Development of a spatial dimension-based taxonomy for classifying the defect patterns in a wafer bin map开发基于空间维度的分类法，用于对晶圆仓图中的缺陷模式进行分类
errADVANCED ENGINEERING INFORMATICS
IF9.9
err2024-04-01
err0
PREAI
errChoi, Seung-Hyun; Lee, Dong-Hee; Kim, Eun-Su; Bae, Young-Mok; Oh, Young-Chan; Kim, Kwang-Jae
err分享
err收藏
Set Response Surface Methodology and its Application in Solving the Wrinkle and Crack Problem in the Auto Industry
errIEEE TRANSACTIONS ON RELIABILITY
IF5.7
err2024-01-01
err0
PREAI
errHe, Yingdong; Ma, Xinyan; Tian, Yu; He, Zhen; Zhang, Xiaoyi; Kim, Kwang-Jae; Bae, Young-Mok
err分享
err收藏
Detecting abnormal behavior of automatic test equipment using autoencoder with event log data
errCOMPUTERS & INDUSTRIAL ENGINEERING
IF6.5
err2023-09-01
err1
PREAI
errBae, Young-Mok; Kim, Young-Gwan; Seo, Jeong-Woo; Kim, Hyun-A; Shin, Chang-Ho; Son, Jeong-Hwan; Lee, Gyu-Ho; Kim, Kwang-Jae
err分享
err收藏
An oversampling method for wafer map defect pattern classification considering small and imbalanced data考虑小数据和不平衡数据的晶片图缺陷模式分类的过采样方法
errCOMPUTERS & INDUSTRIAL ENGINEERING
IF6.5
err2021-12-01
err19
PREAI
errKim, Eun-Su; Choi, Seung-Hyun; Lee, Dong-Hee; Kim, Kwang-Jae; Bae, Young-Mok; Oh, Young-Chan
err分享
err收藏

研究方向

暂时未获取到该数据
合作学者
合作期刊
Z
Zhen He
H 指数: 37 · 论文数: 332
K
Kwang-Jae Kim
H 指数: 30 · 论文数: 146
D
Dong‐Hee Lee
H 指数: 23 · 论文数: 234
Y
Yingdong He
H 指数: 17 · 论文数: 40
王志琼 封面图
王志琼 (Zhiqiong Wang)
H 指数: 14 · 论文数: 91
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