Paul Ronsheim - Publications, H-index & Citations

Paul Ronsheim

international business machines (ibm)

13H指数

59论文数

1.3K被引数

收录论文 4

发表时间

Atom-Probe Tomography of Semiconductor Materials and Device Structures

MRS BULLETIN

IF4.9

2012-03-02

PREAI

Lauhon, Lincoln J.; Adusumilli, Praneet; Ronsheim, Paul; Flaitz, Philip L.; Lawrence, Dan

Round-robin study of arsenic implant dose measurement in silicon by SIMS

APPLIED SURFACE SCIENCE

IF6.9

2006-07-01

PREAI

Simons, D.; Kim, K.; Benbalagh, R.; Bennett, J.; Chew, A.; Gehre, D.; Hasegawa, T.; Hitzman, C.; Ko, J.; Lindstrom, R.; MacDonald, B.; Magee, C.; Montgomery, N.; Peres, P.; Ronsheim, P.; Yoshikawa, S.; Schuhmacher, M.; Stockwell, W.; Sykes, D.; Tomita, A.; Toujou, F.; Won, J.

Quantitative analysis of one-dimensional dopant profile by electron holography

APPLIED PHYSICS LETTERS

IF3.6

2002-04-29

PREAI

McCartney, MR; Gribelyuk, MA; Li, J; Ronsheim, P; McMurray, JS; Smith, DJ

Nitrogen-induced transient enhanced diffusion of dopants

APPLIED PHYSICS LETTERS

IF3.6

2002-04-15

PREAI

Murthy, C; Lee, K; Rengarajan, R; Dokumaci, O; Ronsheim, P; Tews, H; Inaba, S

研究方向