J. L. Freeouf - Publications, H-index & Citations

J. L. Freeouf

机构信息待补充

43H指数

136论文数

6.6K被引数

收录论文 10

发表时间

Dielectric and optical properties of epitaxial rare-earth scandate films and their crystallization behavior

APPLIED PHYSICS LETTERS

IF3.6

2006-06-29

PREAI

Christen, H. M.; Jellison, G. E., Jr.; Ohkubo, I.; Huang, S.; Reeves, M. E.; Cicerrella, E.; Freeouf, J. L.; Jia, Y.; Schlom, D. G.

Directed growth of nickel silicide nanowires

APPLIED PHYSICS LETTERS

IF3.6

2004-02-23

102

PREAI

Decker, CA; Solanki, R; Freeouf, JL; Carruthers, JR; Evans, DR

Measurement of the band offsets between amorphous LaAlO3 and silicon

APPLIED PHYSICS LETTERS

IF3.6

2004-02-02

170

OAAI

Edge, LF; Schlom, DG; Chambers, SA; Cicerrella, E; Freeouf, JL; Holländer, B; Schubert, J

Extreme radiation hardness and light-weighted thin-film indium phosphide solar cell and its computer simulation

SOLAR ENERGY MATERIALS AND SOLAR CELLS

IF6.3

2003-01-01

PREAI

Li, GH; Yang, QF; Yan, ZL; Li, WN; Zhang, S; Freeouf, J; Woodall, JM

Atomic layer deposition of ZnSe/CdSe superlattice nanowires

APPLIED PHYSICS LETTERS

IF3.6

2002-11-11

152

PREAI

Solanki, R; Huo, J; Freeouf, JL; Miner, B

Optical characterization of 4H-SiC by far ultraviolet spectroscopic ellipsometry

APPLIED PHYSICS LETTERS

IF3.6

2001-07-09

PREAI

Lim, SG; Jackson, TN; Mitchel, WC; Bertke, R; Freeouf, JL

Spectral ellipsometry of GaSb:: Experiment and modeling

PHYSICAL REVIEW B

IF3.7

1999-09-15

PREAI

Muñoz, M; Wei, K; Pollak, FH; Freeouf, JL; Charache, GW

Contactless electroreflectance characterization of GaInP/GaAs heterojunction bipolar transistor structures

APPLIED PHYSICS LETTERS

IF3.6

1998-07-13

PREAI

Huang, YS; Sun, WD; Pollak, FH; Freeouf, JL; Calder, ID; Mallard, RE

Spectral ellipsometry investigation of Zn0.53Cd0.47Se lattice matched to InP

PHYSICAL REVIEW B

IF3.7

1997-08-15

103

PREAI

Holden, T; Ram, P; Pollak, FH; Freeouf, JL; Yang, BX; Tamargo, MC

Reflection anisotropy spectroscopy study of the near surface electric field in low-temperature grown GaAs (001)

APPLIED PHYSICS LETTERS

IF3.6

1997-03-03

PREAI

Holden, T; Pollak, FH; Freeouf, JL; McInturff, D; Gray, JL; Lundstrom, M; Woodall, JM

研究方向