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收藏Growth of heavy ion-induced nanodots at the SiO2-Si interface:: Correlation with ultrathin gate oxide reliability
Touboul, AD; Carlotti, JF; Marinoni, M; Caussanel, M; Ramonda, M; Guasch, C; Bruguier, G; Bonnet, J; Saigné, F; Gasiot, J
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收藏Laser heating of thermoluminescent plates: Application to intraoperative radiotherapy
Beteille, D; Setzkorn, R; Prevost, H; Dusseau, L; Fesquet, J; Gasiot, J; Muraro, S; Delard, R; Dubois, JB; Ailleres, N; Missous, O
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