arrow
返回
J

J.D. Plummer

dstl

55H指数
366论文数
1.3W被引数
收录论文 23
发表时间
Effect of Cr content on the mechanical behaviour of a high entropy alloyCr含量对高熵合金力学行为的影响
err2025-11-11
err0
errOAAI
errR.J. Lancaster; D. Paolucci; C.E. Bevan; T. Abdullah; M. Ritchie; A. Olds; L. Wilkin; S. Mehraban; N.P. Lavery; N. Middleton; J. Plummer
err分享
err收藏
A Density Metric for Semiconductor Technology
err2020-04-01
err29
PREAI
errWong, H. -S. Philip; Akarvardar, Kerem; Antoniadis, Dimitri; Bokor, Jeffrey; Hu, Chenming; King-Liu, Tsu-Jae; Mitra, Subhasish; Plummer, James D.; Salahuddin, Sayeef
err分享
err收藏
Single-crystal metal growth on amorphous insulating substrates
err2018-01-08
err17
errOAAI
errZhang, Kai; Pitner, Xue Bai; Yang, Rui; Nix, William D.; Plummer, James D.; Fan, Jonathan A.
err分享
err收藏
Si incorporation from the seed into Ge stripes crystallized using rapid melt growth
err2014-02-06
err16
PREAI
errBai, Xue; Chen, Chien-Yu; Griffin, Peter B.; Plummer, James D.
err分享
err收藏
Atomistic modeling of deactivation and reactivation mechanisms in high-concentration boron profiles
err2003-11-17
err34
PREAI
errAboy, M; Pelaz, L; Marqués, LA; Barbolla, J; Mokhberi, A; Takamura, Y; Griffin, PB; Plummer, JD
err分享
err收藏
Activation and diffusion studies of ion-implanted p and n dopants in germanium
err2003-10-20
err281
PREAI
errChui, CO; Gopalakrishnan, K; Griffin, PB; Plummer, JD; Saraswat, KC
err分享
err收藏
Fluorine interaction with point defects, boron, and arsenic in ion-implanted Si
err2002-05-13
err48
PREAI
errMokhberi, A; Kasnavi, R; Griffin, PB; Plummer, JD
err分享
err收藏
Atomic-scale diffusion mechanisms via intermediate species
err2002-03-19
err8
PREAI
errUral, A; Griffin, PB; Plummer, JD
err分享
err收藏
Silicon self-diffusion under extrinsic conditions
err2001-12-24
err14
PREAI
errUral, A; Griffin, PB; Plummer, JD
err分享
err收藏
err分享
err收藏