Yoav Weizman - Publications, H-index & Citations

Yoav Weizman

bar-ilan university

9H指数

56论文数

344被引数

收录论文 12

发表时间

Controlling Laser Fault Injection Probability, Fault Type, Spatial Resolution, and Number of Single-Spot Multi-Bit Faults in 28 nm FPGA Block RAM 控制激光故障注入概率、故障类型、空间分辨率以及在28 nm FPGA块RAM中的单点多位故障数量

IEEE Transactions on Information Forensics and Security

IF8

2026-06-18

PREAI

Or Nahum; Yoav Weizman; Itamar Levi

RF Leakage in Embedded Devices: Security and Reliability Risks 嵌入式设备中的RF泄漏：安全性与可靠性风险

IEEE Design & Test

IF1.9

2026-02-01

PREAI

Danieli, Erez; Weizman, Yoav; Popovtzer, David; Levi, Itamar

Revisiting Dynamic Logic-A True Candidate for Energy-Efficient Cryogenic Operation in Nanoscaled Technologies

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS

IF5.2

2024-03-01

PREAI

Stanger, Inbal; Roknian, Noam; Shavit, Netanel; Shoshan, Yonatan; Weizman, Yoav; Teman, Adam; Charbon, Edoardo; Fish, Alexander

Silicon Proven 1.29 μm x 1.8 μm 65nm Sub-Vt Optical Sensor for Hardware Security Applications

IEEE ACCESS

IF3.6

2023-01-01

OAAI

Zooker, David; Weizman, Yoav; Fish, Alexander; Keren, Osnat

Toward a Monolithic Pixel Sensor for Heavy Ion Spectroscopy—Pixel Structure Design and Optimization 面向用于重离子光谱的单片像素传感器-像素结构设计和优化

IEEE ACCESS

IF3.6

2023-01-01

OAAI

Cohen, Yaron H.; Weizman, Yoav; Simhony, Yoav; Moyal, Miki; Kuksin, Evgeniy; Fish, Alexander

Low-Cost Side-Channel Secure Standard 6T-SRAM-Based Memory With a 1% Area and Less Than 5% Latency and Power Overheads 低成本的基于6t-sram的侧通道安全标准内存，具有1% 的面积和不到5% 的延迟和功耗开销

IEEE ACCESS

IF3.6

2021-01-01

OAAI

Weizman, Yoav; Giterman, Robert; Chertkow, Oron; Wicentowski, Maoz; Levi, Itamar; Sever, Ilan; Kehati, Ishai; Keren, Osnat; Fish, Alexander

An SRAM-Based PUF With a Capacitive Digital Preselection for a 1E-9 Key Error Probability

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS

IF5.2

2020-12-01

PREAI

Shifman, Yizhak; Miller, Avi; Keren, Osnat; Weizman, Yoav; Shor, Joseph

A Method to Utilize Mismatch Size to Produce an Additional Stable Bit in a Tilting SRAM-Based PUF

IEEE ACCESS

IF3.6

2020-01-01

OAAI

Shifman, Yizhak; Miller, Avi; Keren, Osnat; Weizman, Yoav; Shor, Joseph

Silicon Proven 1.8 μmx9.2 μm 65-nm Digital Bit Generator for Hardware Security Applications

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS

IF4.9

2019-10-01

PREAI

Zooker, David; Avital, Moshe; Weizman, Yoav; Fish, Alexander; Keren, Osnat

Gain-Cell Embedded DRAM-Based Physical Unclonable Function

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS

IF5.2

2018-12-01

PREAI

Giterman, Robert; Weizman, Yoav; Teman, Adam

Optically induced conversion of glow peaks 4 and 5 in LiF:Mg,Ti due to localized and de-localized recombination mechanisms

JOURNAL OF LUMINESCENCE

IF3.6

2000-05-01

PREAI

Weizman, Y; Horowitz, YS; Oster, L

Investigation of the composite structure of peak 5 in the thermoluminescent glow curve of LiF:Mg,Ti (TLD-100) using optical bleaching

JOURNAL OF PHYSICS D-APPLIED PHYSICS

IF3.2

1999-08-12

PREAI

Weizman, Y; Horowitz, YS; Oster, L

研究方向