H. Schwenke - Publications, H-index & Citations

H. Schwenke

aix-marseille universite

27H指数

111论文数

3.8K被引数

收录论文 14

发表时间

Measurement of shallow arsenic impurity profiles in semiconductor silicon using time-of-flight secondary ion mass spectrometry and total reflection x-ray fluorescence spectrometry

JOURNAL OF THE ELECTROCHEMICAL SOCIETY

IF3.3

2019-12-06

PREAI

Schwenke, H; Knoth, J; Fabry, L; Pahlke, S; Scholz, R; Frey, L

Impact of measurement procedure when error mapping and compensating a small CNC machine using a multilateration laser interferometer

PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY

IF3.7

2014-07-01

OAAI

Linares, Jean-Marc; Chaves-Jacob, Julien; Schwenke, Heinrich; Longstaff, Andrew; Fletcher, Simon; Flore, Jakob; Uhlmann, Eckart; Wintering, Jens

On-the-fly calibration of linear and rotary axes of machine tools and CMMs using a tracking interferometer

CIRP ANNALS-MANUFACTURING TECHNOLOGY

IF3.6

2009-01-01

131

PREAI

Schwenke, H.; Schmitt, R.; Jatzkowski, P.; Warmann, C.

Geometric error measurement and compensation of machines-An update

CIRP ANNALS-MANUFACTURING TECHNOLOGY

IF3.6

2008-01-01

754

PREAI

Schwenke, H.; Knapp, W.; Haitjema, H.; Weckenmann, A.; Schmitt, R.; Delbressine, F.

Analysis of small droplets with a new detector for liquid chromatography based on laser-induced breakdown spectroscopy

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY

IF3.8

2005-08-01

PREAI

Janzen, C; Fleige, R; Noll, R; Schwenke, H; Lahmann, W; Knoth, J; Beaven, P; Jantzen, E; Oest, A; Koke, P

Error mapping of CMMs and machine tools by a single tracking interferometer

CIRP ANNALS-MANUFACTURING TECHNOLOGY

IF3.6

2005-01-01

196

PREAI

Schwenke, H; Franke, M; Hannaford, J

Multiple orientation technique for the calibration of cylindrical workpieces on CMMs

PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY

IF3.7

2005-01-01

PREAI

Osawa, S; Busch, K; Franke, M; Schwenke, H

A wavelength-dispersive arrangement for wafer analysis with total reflection X-ray fluorescence spectrometry using synchrotron radiation

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY

IF3.8

2003-12-01

PREAI

Schwenke, H; Beaven, PA; Knoth, J; Jantzen, E

Optical methods for dimensional metrology in production engineering 生产工程中尺寸计量的光学方法

CIRP ANNALS-MANUFACTURING TECHNOLOGY

IF3.6

2002-01-01

250

PREAI

Schwenke, H; Neuschaefer-Rube, U; Pfeifer, T; Kunzmann, H

Calibration of straight total reflection X-ray fluorescence spectrometry - results of a European Round Robin test

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY

IF3.8

2001-11-01

PREAI

Rink, I; Rostam-Khani, P; Knoth, J; Schwenke, H; de Gendt, S; Wortelboer, R

Task specific uncertainty in coordinate measurement

CIRP ANNALS-MANUFACTURING TECHNOLOGY

IF3.6

2001-01-01

148

PREAI

Wilhelm, RG; Hocken, R; Schwenke, H

Ion beam sputtering techniques for high-resolution concentration depth profiling with glancing-incidence X-ray fluorescence spectrometry

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY

IF3.8

1997-07-01

PREAI

Wiener, G; Gunther, R; Michaelsen, C; Knoth, J; Schwenke, H; Bormann, R

Variable X-ray excitation for total reflection X-ray fluorescence spectrometry using an Mo/W alloy anode and a tunable double multilayer monochromator

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY

IF3.8

1997-07-01

PREAI

Knoth, J; Prange, A; Schneider, H; Schwenke, H

Depth profiling using total reflection X-ray fluorescence spectrometry alone and in combination with ion beam sputtering

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY

IF3.8

1997-07-01

PREAI

Schwenke, H; Knoth, J; Gunther, R; Wiener, G; Bormann, R

研究方向