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Yong-Tian Hou

机构信息待补充

8H指数
15论文数
213被引数
收录论文 1
发表时间
Spatial and energetic distribution of border traps in the dual-layer HfO2/SiO2 high-k gate stack by low-frequency capacitance-voltage measurement
err2006-10-20
err18
PREAI
errWu, Wei-Hao; Tsui, Bing-Yue; Chen, Mao-Chieh; Hou, Yong-Tian; Jin, Yin; Tao, Hun-Jan; Chen, Shih-Chang; Liang, Mong-Song
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