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Marek Skowroński

Carnegie Mellon University

51H指数
356论文数
9.3K被引数
收录论文 46
发表时间
Temperature Distribution in TaOx Resistive Switching Devices Assessed In Operando by Scanning Thermal Microscopy
err2023-04-10
err5
errOAAI
errMeng, Jingjia; Goodwill, Jonathan M.; Strelcov, Evgheni; Bao, Kefei; McClelland, Jabez J.; Skowronski, Marek
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Modeling of the Thermodiffusion-Induced Filament Formation in TiN/TaxO1-x/TiN Resistive-Switching Devices
err2022-05-24
err6
PREAI
errMeng, Jingjia; Lian, Enkui; Poplawsky, Jonathan D.; Skowronski, Marek
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Exchange of Ions across the TiN/TaOx Interface during Electroformation of TaOx-Based Resistive Switching Devices
err2020-05-22
err13
errOAAI
errMa, Yuanzhi; Cullen, David A.; Goodwill, Jonathan M.; Xu, Qiyun; More, Karren L.; Skowronski, Marek
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Electrical and Thermal Dynamics of Self-Oscillations in TaOx-Based Threshold Switching Devices
err2020-02-03
err11
PREAI
errYu, Yiqi; Zhao, Bingyuan; Goodwill, Jonathan M.; Ma, Yuanzhi; Bain, James A.; Skowronski, Marek
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Thermal-gradient-driven elemental segregation in Ge2Sb2Te5 phase change memory cells
err2019-04-26
err21
PREAI
errYeoh, Phoebe; Ma, Yuanzhi; Cullen, David A.; Bain, James A.; Skowronski, Marek
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Spontaneous current constriction in threshold switching devices
err2019-04-09
err52
errOAAI
errGoodwill, Jonathan M.; Ramer, Georg; Li, Dasheng; Hoskins, Brian D.; Pavlidis, Georges; McClelland, Jabez J.; Centrone, Andrea; Bain, James A.; Skowronski, Marek
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Formation of the Conducting Filament in TaOx-Resistive Switching Devices by Thermal-Gradient-Induced Cation Accumulation
err2018-06-18
err44
errOAAI
errMa, Yuanzhi; Li, Dasheng; Herzing, Andrew A.; Cullen, David A.; Sneed, Brian T.; More, Karren L.; Nuhfer, N. T.; Bain, James A.; Skowronski, Marek
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Electro-Thermal Model of Threshold Switching in TaOx-Based DevicesTaOx基器件中阈值开关的电热模型
err2017-03-21
err48
PREAI
errGoodwill, Jonathan M.; Sharma, Abhishek A.; Li, Dasheng; Bain, James A.; Skowronski, Marek
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Scaling behavior of oxide-based electrothermal threshold switching devices
err2017-01-01
err25
PREAI
errLi, Dasheng; Goodwill, Jonathan M.; Bain, James A.; Skowronski, Marek
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Transient Thermometry and High-Resolution Transmission Electron Microscopy Analysis of Filamentary Resistive Switches
err2016-07-26
err34
PREAI
errKwon, Jonghan; Sharma, Abhishek A.; Chen, Chao-Yang; Fantini, Andrea; Jurczak, Malgorzata; Herzing, Andrew A.; Bain, James A.; Picard, Yoosuf N.; Skowronski, Marek
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Joule Heating-Induced Metal-Insulator Transition in Epitaxial VO2/TiO2 Devices
err2016-05-10
err114
PREAI
errLi, Dasheng; Sharma, Abhishek A.; Gala, Darshil K.; Shukla, Nikhil; Paik, Hanjong; Datta, Suman; Schlom, Darrell G.; Bain, James A.; Skowronski, Marek
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Low temperature electroformation of TaOx-based resistive switching devices
err2016-01-04
err10
errOAAI
errGala, Darshil K.; Sharma, Abhishek A.; Li, Dasheng; Goodwill, Jonathan M.; Bain, James A.; Skowronski, Marek
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Oxygen vacancies on SrO-terminated SrTiO3(001) surfaces studied by scanning tunneling spectroscopy
err2015-05-11
err27
errOAAI
errSitaputra, Wattaka; Sivadas, Nikhil; Skowronski, Marek; Xiao, Di; Feenstra, Randall M.
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Oxygen Vacancy Creation, Drift, and Aggregation in TiO2-Based Resistive Switches at Low Temperature and Voltage
err2015-03-30
err86
PREAI
errKwon, Jonghan; Sharma, Abhishek A.; Bain, James A.; Picard, Yoosuf N.; Skowronski, Marek
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Electronic Instabilities Leading to Electroformation of Binary Metal Oxide-based Resistive Switches
err2014-07-09
err75
PREAI
errSharma, Abhishek A.; Noman, Mohammad; Abdelmoula, Mohamed; Skowronski, Marek; Bain, James A.
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Mechanism of localized electrical conduction at the onset of electroforming in TiO2 based resistive switching devices
err2014-03-20
err20
PREAI
errNoman, Mohammad; Sharma, Abhishek A.; Lu, Yi Meng; Kamaladasa, Ranga; Skowronski, Marek; Salvador, Paul A.; Bain, James A.
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