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Olaf Rienitz

Physikalisch-Technische Bundesanstalt
H指数:23
被引数:1,805

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An improved protocol for LA-MC-ICP-MS isotope ratio measurements of natural silicon at 213 nm: comparison of mass bias correction factor dependence (solution vs. solid single crystal) and solid sample homogeneity

213 nm下天然硅LA-MC-ICP-MS同位素比值测量的改进协议:质量分馏校正因子依赖性(溶液与固体单晶)及固体样品均匀性比较

2025-01-010
OA
Evaluation of X-ray fluorescence for analysing critical elements in three electronic waste matrices: A comprehensive comparison of analytical techniques
2024-12-010
OAAI
Development and application of reference and routine analytical methods providing SI-traceable results for the determination of technology-critical elements in PCB from WEEE
2024-01-010
OA