Evaluation of X-ray fluorescence for analysing critical elements in three electronic waste matrices: A comprehensive comparison of analytical techniquesWASTE MANAGEMENTIF7.12024-12-010OAAI
Development and application of reference and routine analytical methods providing SI-traceable results for the determination of technology-critical elements in PCB from WEEEJOURNAL OF ANALYTICAL ATOMIC SPECTROMETRYIF3.12024-01-010OA
Combining standard addition and isotope dilution in order to improve SI traceable LA-ICP-MS measurementsJOURNAL OF ANALYTICAL ATOMIC SPECTROMETRYIF3.12022-01-012OA
Liquid metal intercalation of epitaxial graphene: Large-area gallenene layer fabrication through gallium self-propagation at ambient conditionsPHYSICAL REVIEW MATERIALSIF3.42021-02-1919OAAI
A new method for the SI-traceable quantification of element contents in solid samples using LA-ICP-MSJOURNAL OF ANALYTICAL ATOMIC SPECTROMETRYIF3.12020-01-017OAAI
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