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V

Victor M. van Santen

Munich Institute of Robotics and Machine Intelligence

16H指数
43论文数
643被引数
收录论文 12
发表时间
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Cryo-CACTI: Cryogenic-Aware CACTI for Cache Modeling Down to 10K in Advanced 7nm FinFETsCryo-CACTI：面向低温感知的CACTI缓存建模工具，适用于先进7nm FinFET技术节点，温度范围低至10K
errIEEE Transactions on Computers
IF3.8
err2025-08-01
err0
PREAI
errDivya Praneetha Ravipati; Victor M. van Santen; Shivendra Singh Parihar; Yogesh Singh Chauhan; Preeti Ranjan Panda; Hussam Amrouch
err分享
err收藏
Workload Compression Techniques to Scale Defect-Centric BTI Models to the Circuit Level工作负载压缩技术，用于将缺陷中心BTI模型扩展到电路层面
errIEEE Transactions on Circuits and Systems I: Regular Papers
IF0
err2025-05-26
err0
errOAAI
errAndrés Santana Andreo; Victor M. van Santen; Rafael Castro-López; Elisenda Roca; Hussam Amrouch; Francisco V. Fernández
err分享
err收藏
CAPE: Criticality-Aware Performance and Energy Optimization Policy for NCFET-Based Caches
errIEEE TRANSACTIONS ON COMPUTERS
IF3.8
err2024-12-01
err0
PREAI
errRavipati, Divya Praneetha; Goel, Ramanuj; van Santen, Victor M.; Amrouch, Hussam; Panda, Preeti Ranjan
err分享
err收藏
Graph Attention Networks to Identify the Impact of Transistor Degradation on Circuit Reliability图注意网络，以识别晶体管退化对电路可靠性的影响
errIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS
IF5.2
err2024-07-01
err0
PREAI
errMohamed, Tarek; van Santen, Victor M.; Alrahis, Lilas; Sinanoglu, Ozgur; Amrouch, Hussam
err分享
err收藏
Cryogenic CMOS for Quantum Processing: 5-nm FinFET-Based SRAM Arrays at 10 K用于量子处理的低温CMOS: 10 K时基于5 nm FinFET的SRAM阵列
errIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS
IF5.2
err2023-08-01
err18
PREAI
errParihar, Shivendra Singh; van Santen, Victor M.; Thomann, Simon; Pahwa, Girish; Chauhan, Yogesh Singh; Amrouch, Hussam
err分享
err收藏
Massively Parallel Circuit Setup in GPU-SPICE
errIEEE TRANSACTIONS ON COMPUTERS
IF3.8
err2023-08-01
err5
PREAI
errvan Santen, Victor M.; Diep, Fu Lam Florian; Henkel, Jorg; Amrouch, Hussam
err分享
err收藏
On the Reliability of FeFET On-Chip Memory
errIEEE TRANSACTIONS ON COMPUTERS
IF3.8
err2022-04-01
err26
PREAI
errGenssler, Paul R.; van Santen, Victor M.; Henkel, Joerg; Amrouch, Hussam
err分享
err收藏
Minimizing Excess Timing Guard Banding Under Transistor Self-Heating Through Biasing at Zero-Temperature Coefficient
errIEEE ACCESS
IF3.6
err2021-01-01
err10
errOAAI
errSalamin, Sami; Van Santen, Victor M.; Rapp, Martin; Henkel, Joerg; Amrouch, Hussam
err分享
err收藏
On the Workload Dependence of Self-Heating in FinFET Circuits
errIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS
IF4.9
err2020-10-01
err10
PREAI
errvan Santen, Victor M.; Amrouch, Hussam; Kumari, Pooja; Henkel, Jorg
err分享
err收藏
Modeling and Evaluating the Gate Length Dependence of BTI
errIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS
IF4.9
err2019-09-01
err0
PREAI
errvan Santen, Victor M.; Amrouch, Hussam; Henkel, Joerg
err分享
err收藏
Modeling and Mitigating Time-Dependent Variability From the Physical Level to the Circuit Level
errIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS
IF5.2
err2019-07-01
err8
PREAI
errvan Santen, Victor M.; Amrouch, Hussam; Henkel, Joerg
err分享
err收藏
Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV
errIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS
IF5.2
err2018-01-01
err26
PREAI
errvan Santen, Victor M.; Martin-Martinez, Javier; Amrouch, Hussam; Maqueda Nafria, Montserrat; Henkel, Jorg
err分享
err收藏

研究方向

暂时未获取到该数据
合作学者
合作期刊
J
Jörg Henkel
H 指数: 52 · 论文数: 763
Y
Yogesh Singh Chauhan
H 指数: 44 · 论文数: 578
O
Ozgur Sinanoglu
H 指数: 42 · 论文数: 378
M
M. Nafrı́a
H 指数: 36 · 论文数: 351
H
Hussam Amrouch
H 指数: 33 · 论文数: 348
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