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L

Ludovic Broche

European Synchrotron Radiation Facility
H指数:14
被引数:587

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Mechanistic insights into the thermal runaway of cylindrical lithium-ion cells with lithium plating using high speed X-ray computed tomography

利用高速X射线计算机断层扫描技术研究锂沉积圆柱形锂离子电池热失控的机理洞察

Journal of Power Sources
IF7.9
2026-01-010
OA
Charles Kirchner-Burles; Arthur Fordham; Hamish Thomas Reid; Jürgen Pfaff; Matilda Fransson; Ludovic Broche; Sebastian Schopferer; Mahesh Thalwaththe Gedara; Luis Otavio Cortes Magalhaes; Rhodri Jervis; Gareth Hinds; Alexander Rack; Paul Robert Shearing; James B. Robinson
Exploring thermal runaway propagation in Li-ion batteries through high-speed X-ray imaging and thermal analysis: Impact of cell chemistry and electrical connections

通过高速x射线成像和热分析探索锂离子电池中的热失控传播: 电池化学和电气连接的影响

JOURNAL OF POWER SOURCES
IF7.9
2024-10-011
OAAI
Fransson, Matilda; Pfaff, Jonas; Broche, Ludovic; Buckwell, Mark; Kirchner-Burles, Charlie; Reid, Hamish T.; Schopferer, Sebastian; Rack, Alexander; Finegan, Donal P.; Shearing, Paul R.
The battery failure databank: Insights from an open-access database of thermal runaway behaviors of Li-ion cells and a resource for benchmarking risks

电池故障数据库: 来自锂离子电池热失控行为的开放访问数据库和基准风险资源的见解

JOURNAL OF POWER SOURCES
IF7.9
2024-03-0114
OAAI
Finegan, Donal P.; Billman, Julia; Darst, Jacob; Hughes, Peter; Trillo, Jesus; Sharp, Matt; Benson, Alex; Pham, Martin; Kesuma, Inez; Buckwell, Mark; Reid, Hamish T.; Kirchner-Burles, Charlie; Fransson, Matilda; Petrushenko, David; Heenan, Thomas M. M.; Jervis, Rhodri; Owen, Rhodri; Patel, Drasti; Broche, Ludovic; Rack, Alexander; Magdysyuk, Oxana; Keyser, Matt; Walker, William; Shearing, Paul; Darcy, Eric
Sidewall breach during lithium-ion battery thermal runaway triggered by cell-to-cell propagation visualized using high-speed X-ray imaging

使用高速x射线成像可视化的电池到电池传播触发的锂离子电池热失控期间的侧壁破裂

JOURNAL OF ENERGY STORAGE
IF9.8
2023-11-016
OAAI
Fransson, Matilda; Broche, Ludovic; Buckwell, Mark; Pfaff, Jonas; Reid, Hamish; Kirchner-Burles, Charlie; Pham, Martin; Moser, Stefan; Rack, Alexander; Nau, Siegfried; Schopferer, Sebastian; Finegan, Donal P.; Shearing, Paul

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