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Narendra Shiradkar

national centre for photovoltaic research and education

15H指数
96论文数
857被引数
收录论文 23
发表时间
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Effect of abrasive cleaning loads on the durability of hydrophobic anti-soiling coating磨料清洗负载对疏水性防污涂层耐久性的影响
err2025-09-02
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PREAI
errPavan Fuke; Sandeep Kumar; Sudhanshu Mallick; Narendra Shiradkar; Anil Kottantharayil
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Extended Failure Mode and Effects Analysis for Development of Hot Desert Test Cycle Proposal
err2024-11-12
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PREAI
errAdothu, Baloji; Mathiak, Gerhard; Aly, Shahzada Pamir; Alheloo, Ahmad; Almheiri, Ali; Alberts, Vivian; Jackel, Bengt; Gottschalg, Ralph; Shiradkar, Narendra S.; Abdallah, Amir A.; Garcia, Juan Lopez; Salvador, Michael; Hoex, Bram; John, Jim Joseph; Kazem, Hussein A.; Alam, Muhammad Ashraful
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Longitudinal study of c-Si Photovoltaic module degradation rates in the field in India
err2024-11-01
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PREAI
errKorgaonkar, Ruchita; Golive, Yogeswara Rao; Dubey, Rajiv; Kottantharayil, Anil; Vasi, Juzer; Shiradkar, Narendra
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Humidity-Induced electrical conduction in fluropolymer-based photovoltaic backsheets
err2023-10-01
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PREAI
errAnagha, E. R.; Narasimhan, K. L.; Kulkarni, S. V.; Shiradkar, Narendra
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Analysis and mitigation of errors in external quantum efficiency measurement of solar cells embedded in solar modules
err2023-07-01
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PREAI
errJyothi, Kasagani Naga Bhavya; Narasimhan, K. L.; Arora, B. M.; Shiradkar, Narendra
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Abrasion resistance of spray coated anti-soiling coatings during waterless cleaning of PV modules
err2023-06-01
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PREAI
errBhaduri, Sonali; Farkade, Makrand; Bajhal, Rohan; Mallick, Sudhanshu; Shiradkar, Narendra; Kottantharayil, Anil
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Standards development for modules in high temperature micro-environments
err2021-01-31
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errOAAI
errKempe, Michael D.; Holsapple, Derek; Whitfield, Kent; Shiradkar, Narendra
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Manufacturing metrology for c-Si module reliability and durability Part III: Module manufacturing
err2016-06-01
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errOAAI
errSchneller, Eric J.; Brooker, R. Paul; Shiradkar, Narendra S.; Rodgers, Marianne P.; Dhere, Neelkanth G.; Davis, Kristopher O.; Seigneur, Hubert P.; Mohajeri, Nahid; Wohlgemuth, John; Scardera, Giuseppe; Rudack, Andrew C.; Schoenfeld, Winston V.
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Manufacturing metrology for c-Si module reliability and durability Part II: Cell manufacturing
err2016-06-01
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errOAAI
errDavis, Kristopher O.; Rodgers, Marianne P.; Scardera, Giuseppe; Brooker, R. Paul; Seigneur, Hubert; Mohajeri, Nahid; Dhere, Neelkanth G.; Wohlgemuth, John; Schneller, Eric; Shiradkar, Narendra; Rudack, Andrew C.; Schoenfeld, Winston V.
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