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S

Sejun Kim

samsung
H指数:13
被引数:1,266
浏览量:0

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Automotive 2.1 μm Full-Depth Deep Trench Isolation CMOS Image Sensor with a 120 dB Single-Exposure Dynamic Range
SENSORS
IF3.5
2023-11-132
OAAI
Yoo, Dongsuk; Jang, Youngtae; Kim, Youngchan; Shin, Jihun; Lee, Kangsun; Park, Seok-Yong; Shin, Seungho; Lee, Hongsuk; Kim, Seojoo; Park, Joongseok; Park, Cheonho; Lim, Moosup; Bae, Hyungjin; Park, Soeun; Jung, Minwook; Kim, Sungkwan; Choi, Shinyeol; Kim, Sejun; Heo, Jinkyeong; Lee, Hojoon; Lee, KyungChoon; Jeong, Youngkyun; Oh, Youngsun; Keel, Min-Sun; Kim, Bumsuk; Lee, Haechang; Ahn, JungChak

研究方向

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H
Hyungjun Kim
H 指数:79论文数:497被引数:2.3万
Y
Yong‐Young Noh
H 指数:77论文数:540被引数:2.5万
W
Won June Kim
H 指数:13论文数:45被引数:721
H
Hyun‐Sik Kim
H 指数:46论文数:383被引数:1.2万
M
Myung‐Gil Kim
H 指数:39论文数:192被引数:6,914
C
Chang Hyuck Choi
H 指数:53论文数:186被引数:1.0万
S
Se Yun Kim
H 指数:18论文数:103被引数:1,108
M
Minsu Heo
H 指数:8论文数:48被引数:185
A
Alexander A. Ryabin
H 指数:4论文数:7被引数:82
B
Byungki Ryu
H 指数:25论文数:153被引数:2,036