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Evert Pieter Houwman

University of Twente

30H指数
158论文数
3.0K被引数
收录论文 42
发表时间
Structural Properties of Hf0.5Zr0.5O2 Integrated on Silicon (vol 7, pg 8013, 2025)
err2026-01-01
err0
PREAI
errde Hond, Kit; Salverda, Mart; Ahmadi, Majid; Houwman, Evert; Noheda, Beatriz; Kooi, Bart J.; Rijnders, Guus; Koster, Gertjan
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Enhanced Piezoelectricity by Polarization Rotation through Thermal Strain Manipulation in PbZr0.6Ti0.4O3 Thin Films
err2024-06-06
err0
errOAAI
errHuang, Sizhao; Houwman, Evert; Gauquelin, Nicolas; Orekhov, Andrey; Chezganov, Dmitry; Verbeeck, Johan; Hu, Sixia; Zhong, Gaokuo; Koster, Gertjan; Rijnders, Guus
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Toward Design Rules for Multilayer Ferroelectric Energy Storage Capacitors - A Study Based on Lead-Free and Relaxor-Ferroelectric/Paraelectric Multilayer Devices
err2024-04-21
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errOAAI
errNguyen, Minh D.; Houwman, Evert P.; Birkholzer, Yorick A.; Vu, Hung N.; Koster, Gertjan; Rijnders, Guus
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Stabilizing Perovskite Pb(Mg0.33Nb0.67)O3-PbTiO3 Thin Films by Fast Deposition and Tensile Mismatched Growth Template
err2024-02-29
err0
errOAAI
errNi, Shu; Houwman, Evert; Gauquelin, Nicolas; Chezganov, Dmitry; Van Aert, Sandra; Verbeeck, Johan; Rijnders, Guus; Koster, Gertjan
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Epitaxial ferroelectric oxides on silicon with perspectives for future device applications
err2021-04-01
err28
errOAAI
errSpreitzer, Matjaz; Klement, Dejan; Parkelj Potocnik, Tjasa; Trstenjak, Urska; Jovanovic, Zoran; Nguyen, Minh Duc; Yuan, Huiyu; ten Elshof, Johan Evert; Houwman, Evert; Koster, Gertjan; Rijnders, Guus; Fompeyrine, Jean; Kornblum, Lior; Fenning, David P.; Liang, Yunting; Tong, Wen-Yi; Ghosez, Philippe
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Interface degradation and field screening mechanism behind bipolar-cycling fatigue in ferroelectric capacitors
err2021-02-09
err7
errOAAI
errDo, M. T.; Gauquelin, N.; Nguyen, M. D.; Blom, F.; Verbeeck, J.; Koster, G.; Houwman, E. P.; Rijnders, G.
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Hysteresis, Loss and Nonlinearity in Epitaxial PbZr0.55Ti0.45O3Films: A Polarization Rotation Model
err2020-09-23
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errOAAI
errLucke, Philip; Bayraktar, Muharrem; Birkholzer, Yorick A.; Nematollahi, Mohammadreza; Yakshin, Andrey; Rijnders, Guus; Bijkerk, Fred; Houwman, Evert P.
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Interfacial dielectric layer as an origin of polarization fatigue in ferroelectric capacitors
err2020-04-30
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errOAAI
errDo, M. T.; Gauquelin, N.; Nguyen, M. D.; Wang, J.; Verbeeck, J.; Blom, F.; Koster, G.; Houwman, E. P.; Rijnders, G.
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Towards Oxide Electronics: a Roadmap走向氧化物电子学: 路线图
err2019-07-01
err259
errOAAI
errColl, M.; Fontcuberta, J.; Althammer, M.; Bibes, M.; Boschker, H.; Calleja, A.; Cheng, G.; Cuoco, M.; Dittmann, R.; Dkhil, B.; El Baggari, I; Fanciulli, M.; Fina, I; Fortunato, E.; Frontera, C.; Fujita, S.; Garcia, V; Goennenwein, S. T. B.; Granqvist, C-G; Grollier, J.; Gross, R.; Hagfeldt, A.; Herranz, G.; Hono, K.; Houwman, E.; Huijben, M.; Kalaboukhov, A.; Keeble, D. J.; Koster, G.; Kourkoutis, L. F.; Levy, J.; Lira-Cantu, M.; MacManus-Driscoll, J. L.; Mannhart, Jochen; Martins, R.; Menzel, S.; Mikolajick, T.; Napari, M.; Nguyen, M. D.; Niklasson, G.; Paillard, C.; Panigrahi, S.; Rijnders, G.; Sanchez, F.; Sanchis, P.; Sanna, S.; Schlom, D. G.; Schroeder, U.; Shen, K. M.; Siemon, A.; Spreitzer, M.; Sukegawa, H.; Tamayo, R.; van den Brink, J.; Pryds, N.; Granozio, F. Miletto
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Epitaxial Stress-Free Growth of High Crystallinity Ferroelectric PbZr0.52Ti0.48O3 on GaN/AlGaN/Si(111) Substrate
err2017-11-27
err18
errOAAI
errLi, Lin; Liao, Zhaoliang; Gauquelin, Nicolas; Minh Duc Nguyen; Hueting, Raymond J. E.; Gravesteijn, Dirk J.; Lobato, Ivan; Houwman, Evert P.; Lazar, Sorin; Verbeeck, Johan; Koster, Gertjan; Rijnders, Guus
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Controlling Piezoelectric Responses in Pb(Zr0.52Ti0.48)O3 Films through Deposition Conditions and Nanosheet Buffer Layers on Glass
err2017-10-04
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errOAAI
errNguyen, Minh D.; Houwman, Evert P.; Yuan, Huiyu; Eerd, Ben J. Wylie-van; Dekkers, Matthijn; Koster, Gertjan; ten Elshof, Johan E.; Rijnders, Guus
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